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Ke Peng
2010 – today
- 2013
[j4]Fang Bao, Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, LeRoy Winemberg, Mohammad Tehranipoor: Efficient Pattern Generation for Small-Delay Defects Using Selection of Critical Faults. J. Electronic Testing 29(1): 35-48 (2013)
[j3]Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor: Crosstalk- and Process Variations-Aware High-Quality Tests for Small-Delay Defects. IEEE Trans. VLSI Syst. 21(6): 1129-1142 (2013)- 2012
[j2]Yvonne Mery, Jill Newby, Ke Peng: Why One-shot Information Literacy Sessions Are Not the Future of Instruction: A Case for Online Credit Courses. C&RL 73(4): 366-377 (2012)
[j1]Taufiq Choudhry, Frank McGroarty, Ke Peng, Shiyun Wang: High-Frequency Exchange-Rate Prediction with an Artificial Neural Network. Int. Syst. in Accounting, Finance and Management 19(3): 170-178 (2012)- 2011
[b1]Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty: Test and Diagnosis for Small-Delay Defects. Springer 2011, ISBN 978-1-4419-8296-4, pp. I-XVIII, 1-212
[c11]Fang Bao, Ke Peng, Krishnendu Chakrabarty, Mohammad Tehranipoor: On Generation of 1-Detect TDF Pattern Set with Significantly Increased SDD Coverage. Asian Test Symposium 2011: 120-125
[c10]Fang Bao, Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, LeRoy Winemberg, Mohammad Tehranipoor: Critical Fault-Based Pattern Generation for Screening SDDs. European Test Symposium 2011: 177-182
[c9]Ke Peng, Fang Bao, Geoff Shofner, LeRoy Winemberg, Mohammad Tehranipoor: Case Study: Efficient SDD test generation for very large integrated circuits. VTS 2011: 78-83- 2010
[c8]Ke Peng, Yu Huang, Ruifeng Guo, Wu-Tung Cheng, Mohammad Tehranipoor: Emulating and diagnosing IR-drop by using dynamic SDF. ASP-DAC 2010: 511-516
[c7]Sandeep Kumar Goel, Krishnendu Chakrabarty, Mahmut Yilmaz, Ke Peng, Mohammad Tehranipoor: Circuit Topology-Based Test Pattern Generation for Small-Delay Defects. Asian Test Symposium 2010: 307-312
[c6]Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor: A Noise-Aware Hybrid Method for SDD Pattern Grading and Selection. Asian Test Symposium 2010: 331-336
[c5]Ke Peng, Mahmut Yilmaz, Mohammad Tehranipoor, Krishnendu Chakrabarty: High-quality pattern selection for screening small-delay defects considering process variations and crosstalk. DATE 2010: 1426-1431
[c4]Ke Peng, Yu Huang, Pinki Mallick, Wu-Tung Cheng, Mohammad Tehranipoor: Full-circuit SPICE simulation based validation of dynamic delay estimation. European Test Symposium 2010: 101-106
[c3]Ke Peng, Jason Thibodeau, Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor: A novel hybrid method for SDD pattern grading and selection. VTS 2010: 45-50
2000 – 2009
- 2007
[c2]Lihui Guo, Xin He, Yaxin Zhang, Yue Lu, Ke Peng: A Noise Robust Content-Based Music Retrieval System for Mobile Devices. ICME 2007: 2222-2225
[c1]Ke Peng, Hongbin Cai, Yaxin Zhang: Linear histogram equalization in the acoustic feature domain for speech recognition over Bluetooth™ channels. Mobility Conference 2007: 427-430
Coauthor Index
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last updated on 2013-05-28 21:39 CEST by the dblp team



