| 2012 | ||
|---|---|---|
| j2 | Baojun Liu, Li Cai, Xiaokuo Yang, Hongtu Huang, Peng Bai, Weidong Peng: The impact of Miller and coupling effects on single event transient in logical circuits. Microelectronics Journal 43(1): 63-68 (2012) | |
| j1 | Baojun Liu, Li Cai, Peng Bai, Weidong Peng: Reliability evaluation for single event crosstalk via probabilistic transfer matrix. Microelectronics Reliability 52(7): 1511-1514 (2012) | |
| 1 | Peng Bai | |
| 2 | Li Cai | |
| 3 | Hongtu Huang | |
| 4 | Baojun Liu | |
| 5 | Xiaokuo Yang |
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