Octavian Petre

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	2004
j1		Octavian Petre, Hans G. Kerkhoff: Scan Test Strategy for Asynchronous-Synchronous Interfaces. J. Electronic Testing 20(6): 639-645 (2004)
	2002
c2		Octavian Petre, Hans G. Kerkhoff: On-Chip Tap-Delay Measurements for a Digital Delay-Line Used in High-Speed Inter-Chip Data Communications. Asian Test Symposium 2002: 122-
	2001
c1		Octavian Petre, Hans G. Kerkhoff: Increasing the Fault Coverage in Multiple Clock Domain Systems by Using On-Line Testing of Synchronizers. IOLTW 2001: 95-99

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