Frank Poehl

Thomas Rabenalt, Michael Richter, Frank Poehl, Michael Gössel: Highly Efficient Test Response Compaction Using a Hierarchical X-Masking Technique. IEEE Trans. on CAD of Integrated Circuits and Systems 31(6): 950-957 (2012)

Frank Poehl, Frank Demmerle, Juergen Alt, Hermann Obermeir: Production test challenges for highly integrated mobile phone SOCs - A case study. European Test Symposium 2010: 17-22

Frank Poehl, Matthias Beck, Ralf Arnold, Jan Rzeha, Thomas Rabenalt, Michael Gössel: On-chip evaluation, compensation and storage of scan diagnosis data. IET Computers & Digital Techniques 1(3): 207-212 (2007)

Matthias Beck, Olivier Barondeau, Martin Kaibel, Frank Poehl, Xijiang Lin, Ron Press: Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality. CoRR abs/0710.4763 (2007)

Frank Poehl, Jan Rzeha, Matthias Beck, Michael Gössel, Ralf Arnold, Peter Ossimitz: On-Chip Evaluation, Compensation, and Storage of Scan Diagnosis Data - A Test Time Efficient Scan Diagnosis Architecture. European Test Symposium 2006: 239-246

Matthias Beck, Olivier Barondeau, Martin Kaibel, Frank Poehl, Xijiang Lin, Ron Press: Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality. DATE 2005: 56-61

Matthias Beck, Olivier Barondeau, Frank Poehl, Xijiang Lin, Ron Press: Measures to Improve Delay Fault Testing on Low-Cost Testers - A Case Study. VTS 2005: 223-228

Frank Poehl, Matthias Beck, Ralf Arnold, Peter Muhmenthaler, Nagesh Tamarapalli, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski: Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions. ITC 2003: 1211-1220

Frank Poehl, Walter Anheier: Quality Determination for Gate Delay Fault Tests Considering Three-State Elements. J. Electronic Testing 14(1-2): 49-55 (1999)