Dafine Ravelosona Coauthor index pubzone.org

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DBLP keys2012
j1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
W. S. Zhao, Y. Zhang, T. Devolder, Jacques-Olivier Klein, Dafine Ravelosona, Claude Chappert, Pascale Mazoyer: Failure and reliability analysis of STT-MRAM. Microelectronics Reliability 52(9-10): 1848-1852 (2012)
2011
c1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML

Coauthor Index

1Luis Vitório Cargnini
[c1]
2Claude Chappert
[j1] [c1]
3T. Devolder
[j1]
4Yoann Guillemenet
[c1]
5Jacques-Olivier Klein
[j1] [c1]
6Yahya Lakys
[c1]
7Pascale Mazoyer
[j1]
8Gilles Sassatelli
[c1]
9Lionel Torres
[c1]
10Y. Zhang
[j1]
11W. S. Zhao
[j1]
12Weisheng Zhao
[c1]
Last update Sat May 25 21:28:16 2013 CET by the DBLP TeamThis material is Open Data Data released under the ODC-BY 1.0 license — See also our legal information page