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J. Rebollo
Jose Rebollo
2010 – today
- 2012
[j13]I. Cortés, X. Perpiñà, J. Urresti, Xavier Jordà, J. Rebollo: Study of layout influence on ruggedness of NPT-IGBT devices by physical modelling. Microelectronics Reliability 52(9-10): 2471-2476 (2012)- 2011
- [j12]Xavier Perpiñà, Xavier Jordà, Miquel Vellvehí, Jose Rebollo, Michel Mermet-Guyennet: Long-Term Reliability of Railway Power Inverters Cooled by Heat-Pipe-Based Systems. IEEE Transactions on Industrial Electronics 58(7): 2662-2672 (2011)
- [j11]Xavier Perpiñà, Jean-François Serviere, Jesús Urresti-Ibañez, Ignasi Cortés, Xavier Jordà, Salvador Hidalgo, Jose Rebollo, Michel Mermet-Guyennet: Analysis of Clamped Inductive Turnoff Failure in Railway Traction IGBT Power Modules Under Overload Conditions. IEEE Transactions on Industrial Electronics 58(7): 2706-2714 (2011)
2000 – 2009
- 2008
- [j10]I. Cortés, P. Fernández-Martínez, D. Flores, Salvador Hidalgo, J. Rebollo: Superjunction LDMOS on thick-SOI technology for RF applications. Microelectronics Journal 39(6): 922-927 (2008)
- [j9]I. Cortés, P. Fernández-Martínez, D. Flores, Salvador Hidalgo, J. Rebollo: Analysis of punch-through breakdown in bulk silicon RF power LDMOS transistors. Microelectronics Reliability 48(2): 173-180 (2008)
- [j8]X. Perpiñà, Jean-François Serviere, Xavier Jordà, A. Fauquet, Salvador Hidalgo, Jesús Urresti-Ibañez, J. Rebollo, Michel Mermet-Guyennet: IGBT module failure analysis in railway applications. Microelectronics Reliability 48(8-9): 1427-1431 (2008)
- 2007
- [j7]Jesús Urresti-Ibañez, Alberto Castellazzi, M. Piton, J. Rebollo, Michel Mermet-Guyennet, Mauro Ciappa: Robustness test and failure analysis of IGBT modules during turn-off. Microelectronics Reliability 47(9-11): 1725-1729 (2007)
- 2005
- [j6]I. Cortés, J. Roig, D. Flores, J. Urresti, Salvador Hidalgo, J. Rebollo: Analysis of hot-carrier degradation in a SOI LDMOS transistor with a steep retrograde drift doping profile. Microelectronics Reliability 45(3-4): 493-498 (2005)
- [j5]J. Urresti, Salvador Hidalgo, D. Flores, J. Roig, I. Cortés, J. Rebollo: Lateral punch-through TVS devices for on-chip protection in low-voltage applications. Microelectronics Reliability 45(7-8): 1181-1186 (2005)
- 2004
- [j4]Miquel Vellvehí, D. Flores, Xavier Jordà, Salvador Hidalgo, J. Rebollo, L. Coulbeck, P. Waind: Design considerations for 6.5 kV IGBT devices. Microelectronics Journal 35(3): 269-275 (2004)
- [j3]J. Roig, D. Flores, Salvador Hidalgo, J. Rebollo, José Millán: Thin-film silicon-on-sapphire LDMOS structures for RF power amplifier applications. Microelectronics Journal 35(3): 291-297 (2004)
- 2003
- [j2]J. Urresti, Salvador Hidalgo, D. Flores, J. Roig, J. Rebollo, I. Mazarredo: Optimisation of very low voltage TVS protection devices. Microelectronics Journal 34(9): 809-813 (2003)
- 2002
- [j1]J. Roig, D. Flores, Miquel Vellvehí, J. Rebollo, José Millán: Reduction of self-heating effect on SOIM devices. Microelectronics Reliability 42(1): 61-66 (2002)
Coauthor Index
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last updated on 2013-02-14 21:59 CET by the dblp team