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 | 2012 | |
|---|---|---|
| c7 |      | Paolo Rech, Caroline Aguiar, Ronaldo Rodrigues Ferreira, Christopher Frost, Luigi Carro: Neutron radiation test of graphic processing units. IOLTS 2012: 55-60 |
| 2010 | ||
| c6 | | Paolo Rech, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Luigi Dilillo: A Memory Fault Simulator for Radiation-Induced Effects in SRAMs. Asian Test Symposium 2010: 100-105 |
| c5 | | Paolo Rech, Michelangelo Grosso, Fabio Melchiori, D. Loparco, Davide Appello, Luigi Dilillo, Alessandro Paccagnella, Matteo Sonza Reorda: Analysis of root causes of alpha sensitivity variations on microprocessors manufactured using different cell layouts. IOLTS 2010: 29-34 |
| c4 | | Jean Marc Gallière, Paolo Rech, Patrick Girard, Luigi Dilillo: A roaming memory test bench for detecting particle induced SEUs. ITC 2010: 810 |
| 2009 | ||
| c3 | | Paolo Rech, Simone Gerardin, Alessandro Paccagnella, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda, Davide Appello: Evaluating Alpha-induced soft errors in embedded microprocessors. IOLTS 2009: 69-74 |
| c2 | | Davide Appello, Paolo Bernardi, Simone Gerardin, Michelangelo Grosso, Alessandro Paccagnella, Paolo Rech, Matteo Sonza Reorda: DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study. VTS 2009: 276-281 |
| 2007 | ||
| c1 | | Andrea Manuzzato, Paolo Rech, Simone Gerardin, Alessandro Paccagnella, Luca Sterpone, Massimo Violante: Sensitivity Evaluation of TMR-Hardened Circuits to Multiple SEUs Induced by Alpha Particles in Commercial SRAM-Based FPGAs. DFT 2007: 79-86 |
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