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Ivandro Ribeiro

2000 – 2009

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2006
[j1]
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  - electronic edition @ ieeecomputersociety.org
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  - journals/micro/NetoRVWK06
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Egas Henes Neto, Ivandro Ribeiro, Michele G. Vieira, Gilson I. Wirth, Fernanda Lima Kastensmidt: Using Bulk Built-in Current Sensors to Detect Soft Errors. IEEE Micro 26(5): 10-18 (2006)
[c2]
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  - conf/sbcci/WirthRVK06
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Gilson I. Wirth, Ivandro Ribeiro, Michele G. Vieira, Fernanda Gusmão de Lima Kastensmidt: Single event transients in dynamic logic. SBCCI 2006: 184-189
2005
[c1]
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Egas Henes Neto, Ivandro Ribeiro, Michele G. Vieira, Gilson I. Wirth, Fernanda Lima Kastensmidt: Evaluating fault coverage of bulk built-in current sensor for soft errors in combinational and sequential logic. SBCCI 2005: 62-67