Philipp Riess

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	2009
j1		Adrien Ille, Wolfgang Stadler, Thomas Pompl, Harald Gossner, Tilo Brodbeck, Kai Esmark, Philipp Riess, David Alvarez, Kiran V. Chatty, Robert Gauthier, Alain Bravaix: Reliability aspects of gate oxide under ESD pulse stress. Microelectronics Reliability 49(12): 1407-1416 (2009)
	2006
c1		Michael Kropfitsch, Philipp Riess, Gerhard Knoblinger, Dieter Draxelmayr: Dielectric absorption of low-k materials: extraction, modelling and influence on SAR ADCs. ISCAS 2006

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