| 2012 | ||
|---|---|---|
| c3 | Erik Jan Marinissen, Gilbert Vandling, Sandeep Kumar Goel, Friedrich Hapke, Jason Rivers, Nikolaus Mittermaier, Swapnil Bahl: EDA solutions to new-defect detection in advanced process technologies. DATE 2012: 123-128 | |
| c2 | Friedrich Hapke, M. Reese, Jason Rivers, A. Over, V. Ravikumar, Wilfried Redemund, Andreas Glowatz, Jürgen Schlöffel, Janusz Rajski: Cell-aware Production test results from a 32-nm notebook processor. ITC 2012: 1-9 | |
| 2011 | ||
| c1 | Friedrich Hapke, Jürgen Schlöffel, Wilfried Redemund, Andreas Glowatz, Janusz Rajski, M. Reese, J. Rearick, Jason Rivers: Cell-aware analysis for small-delay effects and production test results from different fault models. ITC 2011: 1-8 | |
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