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 | 2008 | |
|---|---|---|
| j5 |      | David F. Heidel, Jack Hergenrother, Kenneth P. Rodbell: Preface. IBM Journal of Research and Development 52(3): 223-224 (2008) |
| j4 | | David F. Heidel, Kenneth P. Rodbell, Ethan H. Cannon, Cyril Cabral Jr., Michael S. Gordon, Phil Oldiges, Henry H. K. Tang: Alpha-particle-induced upsets in advanced CMOS circuits and technology. IBM Journal of Research and Development 52(3): 225-232 (2008) |
| j3 | | Henry H. K. Tang, Conal E. Murray, Giovanni Fiorenza, Kenneth P. Rodbell, Michael S. Gordon, David F. Heidel: New simulation methodology for effects of radiation in semiconductor chip structures. IBM Journal of Research and Development 52(3): 245-254 (2008) |
| j2 | | Michael S. Gordon, Kenneth P. Rodbell, David F. Heidel, Cyril Cabral Jr., Ethan H. Cannon, Daniel D. Reinhardt: Single-event-upset and alpha-particle emission rate measurement techniques. IBM Journal of Research and Development 52(3): 265-274 (2008) |
| 1995 | ||
| j1 | | Chao-Kun Hu, Kenneth P. Rodbell, Timothy D. Sullivan, Kim Y. Lee, Dennis P. Bouldin: Electromigration and stress-induced voiding in fine Al and Al-alloy thin-film lines. IBM Journal of Research and Development 39(4): 465-498 (1995) |
Colors in the list of coauthors
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