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 | 2006 | |
|---|---|---|
| c12 |      | |
| 2004 | ||
| j4 | | Don Edenfeld, Andrew B. Kahng, Mike Rodgers, Yervant Zorian: 2003 Technology Roadmap for Semiconductors. IEEE Computer 37(1): 47-56 (2004) |
| j3 | | Said Hamdioui, Zaid Al-Ars, A. J. van de Goor, Mike Rodgers: Linked faults in random access memories: concept, fault models, test algorithms, and industrial results. IEEE Trans. on CAD of Integrated Circuits and Systems 23(5): 737-757 (2004) |
| 2003 | ||
| j2 | | Said Hamdioui, Zaid Al-Ars, A. J. van de Goor, Mike Rodgers: Dynamic Faults in Random-Access-Memories: Concept, Fault Models and Tests. J. Electronic Testing 19(2): 195-205 (2003) |
| c11 | | Said Hamdioui, Zaid Al-Ars, A. J. van de Goor, Mike Rodgers: March SL: A Test For All Static Linked Memory Faults. Asian Test Symposium 2003: 372-377 |
| c10 | | Said Hamdioui, A. J. van de Goor, Mike Rodgers: Detecting Intra-Word Faults in Word-Oriented Memories. VTS 2003: 241-247 |
| 2002 | ||
| j1 | | Alan Allan, Don Edenfeld, William H. Joyner Jr., Andrew B. Kahng, Mike Rodgers, Yervant Zorian: 2001 Technology Roadmap for Semiconductors. IEEE Computer 35(1): 42-53 (2002) |
| c9 | | Said Hamdioui, A. J. van de Goor, Mike Rodgers: March SS: A Test for All Static Simple RAM Faults. MTDT 2002: 95-100 |
| c8 | | Edward J. McCluskey, Subhasish Mitra, Bob Madge, Peter C. Maxwell, Phil Nigh, Mike Rodgers: Debating the Future of Burn-In. VTS 2002: 311-314 |
| 2001 | ||
| c7 | | Said Hamdioui, A. J. van de Goor, David Eastwick, Mike Rodgers: Detecting Unique Faults in Multi-port SRAMs. Asian Test Symposium 2001: 37-42 |
| c6 | | Said Hamdioui, A. J. van de Goor, David Eastwick, Mike Rodgers: Realistic Fault Models and Test Procedures for Multi-Port SRAMs. MTDT 2001: 65-72 |
| c5 | | Mike Rodgers: ITRS Test Chapter 2001: We'll Tell You What We're Doing, You Tell Us What We Should Be Doing. VTS 2001: 155-157 |
| 2000 | ||
| c4 | | Kwang-Ting Cheng, Sujit Dey, Mike Rodgers, Kaushik Roy: Test challenges for deep sub-micron technologies. DAC 2000: 142-149 |
| c3 |  | |
| c2 | | Mike Rodgers: Defect screening challenges in the Gigahertz/Nanometer age: keeping up with the tails of defect behaviors. ITC 2000: 464-467 |
| c1 | | Said Hamdioui, A. J. van de Goor, Mike Rodgers, David Eastwick: March Tests for Realistic Faults in Two-Port Memories. MTDT 2000: 73-78 |
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