You can find the classic dblp view of this page here.
Steven G. Rothweiler
- [j2]Srimat T. Chakradhar, Steven G. Rothweiler, Vishwani D. Agrawal: Redundancy removal and test generation for circuits with non-Boolean primitives. IEEE Trans. on CAD of Integrated Circuits and Systems 16(11): 1370-1377 (1997)
- [j1]Srimat T. Chakradhar, Vishwani D. Agrawal, Steven G. Rothweiler: A transitive closure algorithm for test generation. IEEE Trans. on CAD of Integrated Circuits and Systems 12(7): 1015-1028 (1993)