Philippe Roussel

M. Toledano-Luque, Ben Kaczer, Jacopo Franco, Philippe Roussel, Tibor Grasser, Guido Groeseneken: Defect-centric perspective of time-dependent BTI variability. Microelectronics Reliability 52(9-10): 1883-1890 (2012)

Lucas Brusamarello, Gilson I. Wirth, Philippe Roussel, Miguel Miranda: Fast and accurate statistical characterization of standard cell libraries. Microelectronics Reliability 51(12): 2341-2350 (2011)

Miguel Miranda, Philippe Roussel, Lucas Brusamarello, Gilson I. Wirth: Statistical characterization of standard cells using design of experiments with response surface modeling. DAC 2011: 77-82

Miguel Miranda, Paul Zuber, Petr Dobrovolný, Philippe Roussel: Variability aware modeling for yield enhancement of SRAM and logic. DATE 2011: 1153-1158

Jouke Verbree, Erik Jan Marinissen, Philippe Roussel, Dimitrios Velenis: On the cost-effectiveness of matching repositories of pre-tested wafers for wafer-to-wafer 3D chip stacking. European Test Symposium 2010: 36-41

Amadou Ndiaye, Guy Della Valle, Philippe Roussel: Qualitative modelling of a multi-step process: The case of French breadmaking. Expert Syst. Appl. 36(2): 1020-1038 (2009)

Miguel Miranda, Bart Dierickx, Paul Zuber, Petr Dobrovolný, F. Kutscherauer, Philippe Roussel, Pavel Poliakov: Variability aware modeling of SoCs: From device variations to manufactured system yield. ISQED 2009: 547-553

Paul Zuber, Vladimir Matvejev, Philippe Roussel, Petr Dobrovolný, Miguel Miranda: Exponent Monte Carlo for Quick Statistical Circuit Simulation. PATMOS 2009: 36-45

Isodiana Crupi, Robin Degraeve, Bogdan Govoreanu, David P. Brunco, Philippe Roussel, Jan Van Houdt: Distribution and generation of traps in SiO₂/Al₂O₃ gate stacks. Microelectronics Reliability 47(4-5): 525-527 (2007)

Ben Kaczer, Robin Degraeve, Philippe Roussel, Guido Groeseneken: Gate oxide breakdown in FET devices and circuits: From nanoscale physics to system-level reliability. Microelectronics Reliability 47(4-5): 559-566 (2007)

D. Trémouilles, Steven Thijs, Philippe Roussel, M. I. Natarajan, Vesselin K. Vassilev, Guido Groeseneken: Transient voltage overshoot in TLP testing - Real or artifact? Microelectronics Reliability 47(7): 1016-1024 (2007)

Antonis Papanikolaou, T. Grabner, Miguel Miranda, Philippe Roussel, Francky Catthoor: Yield prediction for architecture exploration in nanometer technology nodes: : a model and case study for memory organizations. CODES+ISSS 2006: 253-258

Y.-L. Li, Zs. Tökei, Philippe Roussel, Guido Groeseneken, Karen Maex: Layout dependency induced deviation from Poisson area scaling in BEOL dielectric reliability. Microelectronics Reliability 45(9-11): 1299-1304 (2005)

Alain Colmerauer, Philippe Roussel: The Birth of Prolog. HOPL Preprints 1993: 37-52

Maria-Virginia Aponte, José Alberto Fernández, Philippe Roussel: Editing First-Order Proofs: Programmed Rules vs Derived Rules. SLP 1984: 92-98