| 2011 | ||
|---|---|---|
| j7 | Norio Sadachika, Shu Mimura, Akihiro Yumisaki, Koh Johguchi, Akihiro Kaya, Mitiko Miura-Mattausch, Hans Jürgen Mattausch: Prediction of Circuit-Performance Variations from Technology Variations for Reliable 100 nm SOC Circuit Design. IEICE Transactions 94-C(3): 361-367 (2011) | |
| 2010 | ||
| j6 | Koh Johguchi, Akihiro Kaya, Shinya Izumi, Hans Jürgen Mattausch, Tetsushi Koide, Norio Sadachika: Measurement-Based Ring Oscillator Variation Analysis. IEEE Design & Test of Computers 27(5): 6-13 (2010) | |
| 2009 | ||
| j5 | Ryosuke Inagaki, Norio Sadachika, Mitiko Miura-Mattausch, Yasuaki Inoue: A PN Junction-Current Model for Advanced MOSFET Technologies. IEICE Transactions 92-A(4): 983-989 (2009) | |
| j4 | Masataka Miyake, Daisuke Hori, Norio Sadachika, Uwe Feldmann, Mitiko Miura-Mattausch, Hans Jürgen Mattausch, Takahiro Iizuka, Kazuya Matsuzawa, Yasuyuki Sahara, Teruhiko Hoshida, Toshiro Tsukada: Non-Quasi-Static Carrier Dynamics of MOSFETs under Low-Voltage Operation. IEICE Transactions 92-C(5): 608-615 (2009) | |
| j3 | Masataka Miyake, Daisuke Hori, Norio Sadachika, Uwe Feldmann, Mitiko Miura-Mattausch, Hans Jürgen Mattausch, Tatsuya Ohguro, Takahiro Iizuka, Masahiko Taguchi, Shunsuke Miyamoto: Degraded Frequency-Tuning Range and Oscillation Amplitude of LC-VCOs due to the Nonquasi-Static Effect in MOS Varactors. IEICE Transactions 92-C(6): 777-784 (2009) | |
| 2008 | ||
| j2 | Norio Sadachika, Takahiro Murakami, Hideki Oka, Ryou Tanabe, Hans Jürgen Mattausch, Mitiko Miura-Mattausch: Compact Double-Gate Metal-Oxide-Semiconductor Field Effect Transistor Model for Device/Circuit Optimization. IEICE Transactions 91-C(8): 1379-1381 (2008) | |
| j1 | Tatsuya Ezaki, Dondee Navarro, Youichi Takeda, Norio Sadachika, G. Suzuki, Mitiko Miura-Mattausch, Hans Jürgen Mattausch, Tatsuya Ohguro, Takahiro Iizuka, Masahiko Taguchi, Shigetaka Kumashiro, Shunsuke Miyamoto: Non-quasi-static approach with surface-potential-based MOSFET model HiSIM for RF circuit simulations. Mathematics and Computers in Simulation 79(4): 1096-1106 (2008) | |
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