A. C. Salaün

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	2002
j1		E. Carvou, F. Le Bihan, A. C. Salaün, R. Rogel, Olivier Bonnaud, Yannick Rey-Tauriac, Xavier Gagnard, L. Roland: Reliability improvement of high value doped polysilicon-based resistors. Microelectronics Reliability 42(9-11): 1369-1372 (2002)

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