Kevin Sanchez

David Veyrié, Olivier Gilard, Kevin Sanchez, Sébastien Lhuillier, Frédéric Bourcier: New methodology for the assessment of the thermal resistance of laser diodes and light emitting diodes. Microelectronics Reliability 50(4): 456-461 (2010)

A. Deyine, Kevin Sanchez, Philippe Perdu, F. Battistella, Dean Lewis: CADless laser assisted methodologies for failure analysis and device reliability. Microelectronics Reliability 50(9-11): 1236-1240 (2010)

M. Sienkiewicz, Philippe Perdu, Abdellatif Firiti, Kevin Sanchez, O. Crépel, Dean Lewis: Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs. Microelectronics Reliability 48(8-9): 1529-1532 (2008)

Felix Beaudoin, Kevin Sanchez, Philippe Perdu: Dynamic laser stimulation techniques for advanced failure analysis and design debug applications. Microelectronics Reliability 47(9-11): 1517-1522 (2007)

Julie Ferrigno, Philippe Perdu, Kevin Sanchez, Dean Lewis: Identification of process/design issues during 0.18 µm technology qualification for space application. DATE 2007: 989-993

Kevin Sanchez, Romain Desplats, Felix Beaudoin, Philippe Perdu, J. P. Roux, G. Woods, Dean Lewis: NIR laser stimulation for dynamic timing analysis. Microelectronics Reliability 45(9-11): 1459-1464 (2005)

Felix Beaudoin, Kevin Sanchez, Romain Desplats, Philippe Perdu, J. M. Nicot, J. P. Roux, M. Otte: Dynamic Laser Stimulation Case Studies. Microelectronics Reliability 45(9-11): 1538-1543 (2005)

Kevin Sanchez, Romain Desplats, G. Perez, V. Pichetto, Felix Beaudoin, Philippe Perdu: Solar Cell Analysis with Light Emission and OBIC Techniques. Microelectronics Reliability 43(9-11): 1755-1760 (2003)