A. Schütz

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	1982
j1		A. Schütz, Siegfried Selberherr, Hans W. Pötzl: Analysis of Breakdown Phenomena in MOSFET's. IEEE Trans. on CAD of Integrated Circuits and Systems 1(2): 77-85 (1982)

Coauthor Index

1	Hans W. Pötzl	[j1]
2	Siegfried Selberherr	[j1]

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