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 | 2010 | |
|---|---|---|
| j1 |      | S. Libertino, D. Corso, G. Murè, A. Marino, F. Palumbo, F. Principato, G. Cannella, T. Schillaci, S. Giarusso, F. Celi, M. Lisiansky, Y. Roizin, Salvatore Lombardo: Radiation effects in nitride read-only memories. Microelectronics Reliability 50(9-11): 1857-1860 (2010) |
| 1 | G. Cannella | |
| 2 | F. Celi | |
| 3 | D. Corso | |
| 4 | S. Giarusso | |
| 5 | S. Libertino | |
| 6 | M. Lisiansky | |
| 7 | Salvatore Lombardo | |
| 8 | A. Marino | |
| 9 | G. Murè | |
| 10 | F. Palumbo | |
| 11 | F. Principato | |
| 12 | Y. Roizin |
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