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You can find the classic dblp view of this page here.
You can find the classic dblp view of this page here.
K. S. See
2000 – 2009
- 2008
[j1]W. S. Lau, K. S. See, C. W. Eng, W. K. Aw, K. H. Jo, K. C. Tee, James Y. M. Lee, Elgin K. B. Quek, H. S. Kim, Simon T. H. Chan, L. Chan: Anomalous narrow width effect in p-channel metal-oxide-semiconductor surface channel transistors using shallow trench isolation technology. Microelectronics Reliability 48(6): 919-922 (2008)
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last updated on 2012-12-02 21:48 CET by the dblp team



