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 | 2006 | |
|---|---|---|
| j3 |      | Markus Seuring: Combining Scan Test and Built-in Self Test. J. Electronic Testing 22(3): 297-299 (2006) |
| 2003 | ||
| j2 | | Krishnendu Chakrabarty, Markus Seuring: Space compaction of test responses using orthogonal transmission functions [logic testing]. IEEE T. Instrumentation and Measurement 52(5): 1353-1362 (2003) |
| j1 | | Adit D. Singh, Markus Seuring, Michael Gössel, Egor S. Sogomonyan: Multimode scan: Test per clock BIST for IP cores. ACM Trans. Design Autom. Electr. Syst. 8(4): 491-505 (2003) |
| 2000 | ||
| c6 | | Debaleena Das, Nur A. Touba, Markus Seuring, Michael Gössel: Low Cost Concurrent Error Detection Based on Modulo Weight-Based Codes. IOLTW 2000: 171- |
| c5 | | Markus Seuring, Krishnendu Chakrabarty: Space Compaction of Test Responses for IP Cores Using Orthogonal Transmission Functions. VTS 2000: 213-220 |
| 1999 | ||
| c4 | | Markus Seuring, Michael Gössel: A Structural Approach for Space Compaction for Sequential Circuits. DFT 1999: 227- |
| c3 | | Adit D. Singh, Egor S. Sogomonyan, Michael Gössel, Markus Seuring: Testability evaluation of sequential designs incorporating the multi-mode scannable memory element. ITC 1999: 286-293 |
| c2 | | Markus Seuring, Michael Gössel: A Structural Method for Output Compaction of Sequential Automata Implemented as Circuits. WIA 1999: 158-163 |
| 1998 | ||
| c1 | | Markus Seuring, Michael Gössel, Egor S. Sogomonyan: A Structural Approach for Space Compaction for Concurrent Checking and BIST. VTS 1998: 354-361 |
| 1 | Krishnendu Chakrabarty | |
| 2 | Debaleena Das | |
| 3 | Michael Gössel | |
| 4 | Adit D. Singh | |
| 5 | Egor S. Sogomonyan | |
| 6 | Nur A. Touba |
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