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 | 2009 | |
|---|---|---|
| c8 |      | Vineeth Veetil, Dennis Sylvester, David Blaauw, Saumil Shah, Steffen Rochel: Efficient smart sampling based full-chip leakage analysis for intra-die variation considering state dependence. DAC 2009: 154-159 |
| 2008 | ||
| j2 | | Dennis Sylvester, Kanak Agarwal, Saumil Shah: Variability in nanometer CMOS: Impact, analysis, and minimization. Integration 41(3): 319-339 (2008) |
| j1 | | Ashish Srivastava, Kaviraj Chopra, Saumil Shah, Dennis Sylvester, David Blaauw: A Novel Approach to Perform Gate-Level Yield Analysis and Optimization Considering Correlated Variations in Power and Performance. IEEE Trans. on CAD of Integrated Circuits and Systems 27(2): 272-285 (2008) |
| c7 | | Puneet Gupta, Andrew B. Kahng, Youngmin Kim, Saumil Shah, Dennis Sylvester: Investigation of diffusion rounding for post-lithography analysis. ASP-DAC 2008: 480-485 |
| 2007 | ||
| c6 | | Puneet Gupta, Andrew B. Kahng, Youngmin Kim, Saumil Shah, Dennis Sylvester: Line-End Shortening is Not Always a Failure. DAC 2007: 270-271 |
| 2006 | ||
| c5 | | Saumil Shah, Puneet Gupta, Andrew B. Kahng: Standard cell library optimization for leakage reduction. DAC 2006: 983-986 |
| 2005 | ||
| c4 | | Ashish Srivastava, Saumil Shah, Kanak Agarwal, Dennis Sylvester, David Blaauw, Stephen W. Director: Accurate and efficient gate-level parametric yield estimation considering correlated variations in leakage power and performance. DAC 2005: 535-540 |
| c3 |  | Saumil Shah, Ashish Srivastava, Dushyant Sharma, Dennis Sylvester, David Blaauw, Vladimir Zolotov: Discrete Vt assignment and gate sizing using a self-snapping continuous formulation. ICCAD 2005: 705-712 |
| c2 | | Kaviraj Chopra, Saumil Shah, Ashish Srivastava, David Blaauw, Dennis Sylvester: Parametric yield maximization using gate sizing based on efficient statistical power and delay gradient computation. ICCAD 2005: 1023-1028 |
| 2004 | ||
| c1 | | Saumil Shah, Kanak Agarwal, Dennis Sylvester: A New Threshold Voltage Assignment Scheme for Runtime Leakage Reduction in On-Chip Repeaters. ICCD 2004: 138-143 |
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