Manish Sharma

Dhruv Jain, Himanshu Gupta, Deeksha Gautam, Mayank Kumar, Vinay J. Ribeiro, Manish Sharma: Whitespace networks for vehicular communication. COMSNETS 2013: 1-2

Brady Benware, Chris Schuermyer, Manish Sharma, Thomas Herrmann: Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results. IEEE Design & Test of Computers 29(1): 8-18 (2012)

Xiaoxin Fan, Manish Sharma, Wu-Tung Cheng, Sudhakar M. Reddy: Diagnosis of Cell Internal Defects with Multi-cycle Test Patterns. ATS 2012: 7-12

Ramesh P. Singh, Manish Sharma: Enhancement of BC concentration associated with Diwali festival in India. IGARSS 2012: 3685-3688

Manish Sharma, Gurpadam Singh: Performance evaluation aodv, . CoRR abs/1202.1720 (2012)

Manish Sharma, Gurpadam Singh: Evaluation of Proactive, Reactive and Hybrid Ad hoc Routing Protocol for various Battery models in VANET using Qualnet. CoRR abs/1205.2678 (2012)

Manish Sharma, Avijit Dutta, Wu-Tung Cheng, Brady Benware, Mark Kassab: A novel Test Access Mechanism for failure diagnosis of multiple isolated identical cores. ITC 2011: 1-9

Manish Sharma, Gurpadam Singh: Evaluation of Proactive Fisheye Ad Hoc Source Routing Protocol for Various Battery Models in VANET Using Qualnet. SocProS (1) 2011: 269-278

Manish Sharma, Chris Schuermyer, Brady Benware: Determination of Dominant-Yield-Loss Mechanism with Volume Diagnosis. IEEE Design & Test of Computers 27(3): 54-61 (2010)

Manish Sharma, Jaime Portugheis: Communication Theory On the sum capacity of a T-user N-frequency multiple access channel with noise. European Transactions on Telecommunications 21(1): 23-29 (2010)

Manish Sharma, Ajay Kulkarni, Sachin Puntambekar: Wavelet Based Adaptive Tracking Control for Uncertain Nonlinear Systems with Input Constraints. ARTCom 2009: 694-698

Manish Sharma, Ajay Kulkarni, Ajay Verma: Wavelet Adaptive Observer Based Control for a Class of Uncertain Time Delay Nonlinear Systems with Input Constraints. ARTCom 2009: 863-867

Yan Liu, Scott Hareland, Donald Hall, Bill Wold, Roger Hubing, Robert Mehregan, Ronen Malka, Manish Sharma, Tom Lane: A Simulation-based strategy used in electrical design for reliability. ISQED 2009: 208-212

Manish Sharma, Brady Benware, Lei Ling, David Abercrombie, Lincoln Lee, Martin Keim, Huaxing Tang, Wu-Tung Cheng, Ting-Pu Tai, Yi-Jung Chang, Reinhart Lin, Albert Mann: Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data. ITC 2008: 1-9

Jerzy Tyszer, Janusz Rajski, Grzegorz Mrugalski, Nilanjan Mukherjee, Mark Kassab, Wu-Tung Cheng, Manish Sharma, Liyang Lai: X-Tolerant Compactor with On-Chip Registration and Signature-Based Diagnosis. IEEE Design & Test of Computers 24(5): 476-485 (2007)

Huaxing Tang, Manish Sharma, Janusz Rajski, Martin Keim, Brady Benware: Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement. European Test Symposium 2007: 145-150

Chen Liu, Wei Zou, Sudhakar M. Reddy, Wu-Tung Cheng, Manish Sharma, Huaxing Tang: Interconnect open defect diagnosis with minimal physical information. ITC 2007: 1-10

Manish Sharma, Wu-Tung Cheng, Ting-Pu Tai, Y. S. Cheng, Will Hsu, Chen Liu, Sudhakar M. Reddy, Albert Mann: Faster defect localization in nanometer technology based on defective cell diagnosis. ITC 2007: 1-10

Wu-Tung Cheng, Manish Sharma, Thomas Rinderknecht, Liyang Lai, Chris Hill: Signature Based Diagnosis for Logic BIST. ITC 2006: 1-9

Martin Keim, Nagesh Tamarapalli, Huaxing Tang, Manish Sharma, Janusz Rajski, Chris Schuermyer, Brady Benware: A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis. ITC 2006: 1-10

Manish Sharma, Wu-Tung Cheng: X-filter: filtering unknowns from compacted test responses. ITC 2005: 9

Manish Sharma, Janak H. Patel: What Does Robust Testing a Subset of Paths, Tell us about the Untested Paths in the Circuit? VTS 2004: 31-36

Manish Sharma, Janak H. Patel, Jeff Rearick: Test Data Compression and Test Time Reduction of Longest-Path-Per-Gate Tests based on Illinois Scan Architecture. VTS 2003: 15-21

Keerthi Heragu, Manish Sharma, Rahul Kundu, Ronald D. Blanton: Test vector generation for charge sharing failures in dynamic logic. IEEE Trans. on CAD of Integrated Circuits and Systems 21(12): 1502-1508 (2002)

Manish Sharma, Janak H. Patel: Finding a Small Set of Longest Testable Paths that Cover Every Gate. ITC 2002: 974-982

Manish Sharma, Janak H. Patel: Testing of critical paths for delay faults. ITC 2001: 634-641

Keerthi Heragu, Manish Sharma, Rahul Kundu, R. D. (Shawn) Blanton: Testing of Dynamic Logic Circuits Based on Charge Sharing. VTS 2001: 396-403

Manish Sharma, Janak H. Patel: Enhanced delay defect coverage with path-segments. ITC 2000: 385-392

Manish Sharma, Janak H. Patel: Bounding Circuit Delay by Testing a Very Small Subset of Paths. VTS 2000: 333-342

C. P. Ravikumar, Manish Sharma, R. K. Patney: Improving the Diagnosability of Digital Circuits. VLSI Design 1999: 629-634

Manish Sharma, Richard J. Mammone: "blind" speech segmentation: automatic segmentation of speech without linguistic knowledge. ICSLP 1996

Jeff Konicek, Tracy Tilton, Alexander V. Veidenbaum, Chuan-Qi Zhu, Edward S. Davidson, Ruppert A. Downing, Michael J. Haney, Manish Sharma, Pen-Chung Yew, P. Michael Farmwald, David J. Kuck, Daniel M. Lavery, Robert A. Lindsey, D. Pointer, John T. Andrews, Thomas Beck, T. Murphy, Stephen W. Turner, Nancy J. Warter: The Organization of the Cedar System. ICPP (1) 1991: 49-56