P. Shearon
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1984
j1
D. Leet
,
P. Shearon
,
R. France
:
A CMOS LSSD Test Generation System.
IBM Journal of Research and Development 28
(5): 625-635 (1984)
Coauthor Index
1
R. France
[j1]
2
D. Leet
[j1]
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