| 2011 | ||
|---|---|---|
| j3 | Hoon-Ki Lee, S. V. Jagadeesh Chandra, Kyu-Hwan Shim, Jong-Won Yoon, Chel-Jong Choi: Electrical and Structural Properties of Metal-Oxide-Semiconductor (MOS) Devices with Pt/Ta2O5 Gate Stacks. IEICE Transactions 94-C(5): 846-849 (2011) | |
| 2008 | ||
| j2 | Sang-Sik Choi, A-Ram Choi, Jae-Yeon Kim, Jeon-Wook Yang, Yong-Woo Hwang, Tae-Hyun Han, Deok Ho Cho, Kyu-Hwan Shim: Stress Effect Analysis for PD SOI pMOSFETs with Undoped-Si0.88Ge0.12 Heterostructure Channel. IEICE Transactions 91-C(5): 716-720 (2008) | |
| j1 | A-Ram Choi, Sang-Sik Choi, Byung-Guan Park, Dongwoo Suh, Gyungock Kim, Jin-Tae Kim, Jin-Soo Choi, Deok Ho Cho, Tae-Hyun Han, Kyu-Hwan Shim: Selective Epitaxial Growth of SiGe Layers with High Aspect Ratio Mask of Dielectric Films. IEICE Transactions 91-C(5): 767-771 (2008) | |
Colors in the list of coauthors
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