| 2010 | ||
|---|---|---|
| j6 | ||
| 2008 | ||
| c24 | Hiroharu Kawanaka, Yujiro Shiroyama, Shinji Tsuruoka, Tsuyoshi Shinogi, Koji Yamamoto: A Study on Document Structure Recognition of Discharge Summaries for Analogous Case Search System. Document Analysis Systems 2008: 423-430 | |
| 2007 | ||
| j5 | Halpage Chinthaka Nuwandika Premachandra, Hiroharu Kawanaka, Tomohiro Yoshikawa, Shinji Tsuruoka, Tsuyoshi Shinogi: A Study on Modeling Error Estimation for Mobile Robot Based on Coevolutionary Computation and Image Processing. JACIII 11(7): 825-832 (2007) | |
| c23 | Hiroharu Kawanaka, Yoshihiro Otani, Koji Yamamoto, Tsuyoshi Shinogi, Shinji Tsuruoka: Tendency discovery from incident report map generated by self organizing map and its development. SMC 2007: 2016-2021 | |
| 2005 | ||
| j4 | Terumine Hayashi, Haruna Yoshioka, Tsuyoshi Shinogi, Hidehiko Kita, Haruhiko Takase: On Test Data Compression Using Selective Don't-Care Identification. J. Comput. Sci. Technol. 20(2): 210-215 (2005) | |
| c22 | Tsuyoshi Shinogi, Hiroyuki Yamada, Terumine Hayashi, Shinji Tsuruoka, Tomohiro Yoshikawa: A Test Cost Reduction Method by Test Response and Test Vector Overlapping for Full-Scan Test Architecture. Asian Test Symposium 2005: 366-371 | |
| c21 | Yoshihiro Otani, Hiroharu Kawanaka, Tomohiro Yoshikawa, Koji Yamamoto, Tsuyoshi Shinogi, Shinji Tsuruoka: Keyword Extraction from Incident Reports and Keyword Map Generation Method Using Self Organizing Map. SMC 2005: 1024-1029 | |
| c20 | Yoshihiro Otani, Hiroharu Kawanaka, Tomohiro Yoshikawa, Koji Yamamoto, Tsuyoshi Shinogi, Shinji Tsuruoka: Keyword Extraction from Incident Reports and Keyword Map Generation Method Using Self Organizing Map. SMC 2005: 1030-1035 | |
| 2004 | ||
| c19 | Terumine Hayashi, Haruna Yoshioka, Tsuyoshi Shinogi, Hidehiko Kita, Haruhiko Takase: Test data compression technique using selective don't-care identification. ASP-DAC 2004: 230-233 | |
| 2003 | ||
| c18 | Tsuyoshi Shinogi, Yuki Yamada, Terumine Hayashi, Tomohiro Yoshikawa, Shinji Tsuruoka: Between-Core Vector Overlapping for Test Cost Reduction in Core Testing. Asian Test Symposium 2003: 268-273 | |
| c17 | Hiroharu Kawanaka, Tomohiro Yoshikawa, Yoshifumi Banno, Tsuyoshi Shinogi, Shinji Tsuruoka: A study on territories by similarity of chromosomes for fitness inference method. SMC 2003: 3571-3576 | |
| 2002 | ||
| j3 | Yoshifumi Banno, Tomohiro Yoshikawa, Hiroharu Kawanaka, Tsuyoshi Shinogi, Shinji Tsuruoka: A Study on Deriving a Method for Chromosome Similarities Suitable for the Search Space. JACIII 6(3): 135-144 (2002) | |
| c16 | Teruyuki Yamaguchi, Shinji Tsuruoka, Tomohiro Yoshikawa, Tsuyoshi Shinogi, Eiji Makimoto, Hisao Ogata, Malayappan Shridhar: A segmentation system for touching handwritten Japanese characters. IWFHR 2002: 407-412 | |
| c15 | Ryouji Minehara, Tomoki Matsumoto, Tsuyoshi Shinogi, Tomohiro Yoshikawa, Shinji Tsuruoka: An Automatic Recording System of the Plays and Moves of SHOGI Games Using Image Processing Technique. MVA 2002: 52-55 | |
| 2001 | ||
| j2 | Junzhi Sang, Tsuyoshi Shinogi, Haruhiko Takase, Hidehiko Kita, Terumine Hayashi: An enhanced fault model for high defect coverage. Systems and Computers in Japan 32(6): 36-44 (2001) | |
| c14 | Tsuyoshi Shinogi, Tomokazu Kanbayashi, Tomohiro Yoshikawa, Shinji Tsuruoka, Terumine Hayashi: Faulty Resistance Sectioning Technique for Resistive Bridging Fault ATPG Systems. Asian Test Symposium 2001: 76-81 | |
| c13 | Shinji Tsuruoka, Toru Yamaguchi, Kenji Kato, Tomohiro Yoshikawa, Tsuyoshi Shinogi: A Camera Control Based Fuzzy Behaviour Recognition of Lecturer for Distance Lecture. FUZZ-IEEE 2001: 940-943 | |
| c12 | Shinji Tsuruoka, Toru Tanaka, Tomohiro Yoshikawa, Tsuyoshi Shinogi, Kensuke Takao: Region Segmentation for Table Image with Unknown Complex Structure. ICDAR 2001: 709- | |
| c11 | Teruyuki Yamaguchi, Tomohiro Yoshikawa, Tsuyoshi Shinogi, Shinji Tsuruoka, Masato Teramoto: A Segmentation Method for Touching Japanese Handwritten Characters Based on Connecting Condition of Line. ICDAR 2001: 837- | |
| 2000 | ||
| c10 | Tsuyoshi Shinogi, Masahiro Ushio, Terumine Hayashi: Cyclic greedy generation method for limited number of IDDQ tests. Asian Test Symposium 2000: 362- | |
| c9 | Haruhiko Takase, Tsuyoshi Shinogi, Terumine Hayashi, Hidehiko Kita: Evaluation Function for Fault Tolerant Multi-Layer Neural Networks. IJCNN (3) 2000: 521-526 | |
| 1999 | ||
| j1 | Tsuyoshi Shinogi, Terumine Hayashi, Kazuo Taki: Test generation for stuck-on faults in pass-transistor logic SPL and implementation of DFT circuits. Systems and Computers in Japan 30(7): 55-68 (1999) | |
| c8 | Kai Zhang, Tsuyoshi Shinogi, Haruhiko Takase, Terumine Hayashi: A Method for Evaluating Upper Bound of Simultaneous Switching Gates Using Circuit Partition. ASP-DAC 1999: 291-294 | |
| c7 | Tsuyoshi Shinogi, Terumine Hayashi: A Parallel Generation System of Compact IDDQ Test Sets for Large Combinational Circuits. Asian Test Symposium 1999: 164- | |
| 1998 | ||
| c6 | Junzhi Sang, Tsuyoshi Shinogi, Haruhiko Takase, Terumine Hayashi: On a Logical Fault Model H1SGLF for Enhancing Defect Coverage. Asian Test Symposium 1998: 102-107 | |
| c5 | Tsuyoshi Shinogi, Terumine Hayashi: A Simple and Efficient Method for Generating Compact IDDQ Test Set for Bridging Fault. VTS 1998: 112-117 | |
| 1997 | ||
| c4 | Tsuyoshi Shinogi, Terumine Hayashi, Kazuo Taki: Test Generation for Stuck-On Faults in BDD-Based Pass-Transistor Logic SPL. Asian Test Symposium 1997: 16-21 | |
| 1992 | ||
| c3 | Kouichi Kumon, Akira Asato, Susumu Arai, Tsuyoshi Shinogi, Akira Hattori, Hiroyoshi Hatazawa, Kiyoshi Hirano: Architecture and Implementation of PIM/p. FGCS 1992: 414-424 | |
| 1988 | ||
| c2 | Tsuyoshi Shinogi, Kouichi Kumon, Akira Hattori, Atsuhiro Goto, Yasunori Kimura, Takashi Chikayama: Macro-Call Instruction for the Efficient KL1 Implementation on PIM. FGCS 1988: 953-961 | |
| 1985 | ||
| c1 | Mitsuhiro Kishimoto, Tsuyoshi Shinogi, Yasunori Kimura, Akira Hattori: Design and Evaluation of a Prolog Compiler. LP 1985: 192-203 | |
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