Please note: This is a beta version of the new dblp website.
You can find the classic dblp view of this page here.
You can find the classic dblp view of this page here.
W. Skorupa
2000 – 2009
- 2009
[j3]C. Y. Zhu, C. C. Ling, G. Brauer, W. Anwand, W. Skorupa: Deep-level defects study of arsenic-implanted ZnO single crystal. Microelectronics Journal 40(2): 286-288 (2009)- 2005
[j2]M. Helm, J. M. Sun, J. Potfajova, T. Dekorsy, B. Schmidt, W. Skorupa: Efficient silicon based light emitters. Microelectronics Journal 36(11): 957-962 (2005)- 2002
[j1]A. N. Nazarov, I. N. Osiyuk, V. S. Lysenko, T. Gebel, L. Rebohle, W. Skorupa: Charge trapping and degradation in Ge+ ion implanted SiO2 layers during high-field electron injection. Microelectronics Reliability 42(9-11): 1461-1464 (2002)
Coauthor Index
data released under the ODC-BY 1.0 license. See also our legal information page
last updated on 2012-12-02 20:31 CET by the dblp team



