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 | 2004 | |
|---|---|---|
| j1 |      | Y. C. Chou, D. Leung, I. Smorchkova, M. Wojtowicz, R. Grundbacher, L. Callejo, Q. Kan, R. Lai, P. H. Liu, D. Eng: Degradation of AlGaN/GaN HEMTs under elevated temperature lifetesting. Microelectronics Reliability 44(7): 1033-1038 (2004) |
| 1 | L. Callejo | |
| 2 | Y. C. Chou | |
| 3 | D. Eng | |
| 4 | R. Grundbacher | |
| 5 | Q. Kan | |
| 6 | R. Lai | |
| 7 | D. Leung | |
| 8 | P. H. Liu | |
| 9 | M. Wojtowicz |
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