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 | 2008 | |
|---|---|---|
| j7 |      | Michael Gössel, Egor S. Sogomonyan: A Non-linear Split Error Detection Code. Fundam. Inform. 83(1-2): 109-115 (2008) |
| 2006 | ||
| j6 | | Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan, Daniel Marienfeld: Modulo p=3 Checking for a Carry Select Adder. J. Electronic Testing 22(1): 101-107 (2006) |
| c24 | | Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel: A New Self-Checking and Code-Disjoint Non-Restoring Array Divider. IOLTS 2006: 23-30 |
| c23 | | Cristian Grecu, André Ivanov, Res Saleh, Egor S. Sogomonyan, Partha Pratim Pande: On-line Fault Detection and Location for NoC Interconnects. IOLTS 2006: 145-150 |
| 2005 | ||
| c22 | | Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel: New Self-checking Output-Duplicated Booth Multiplier with High Fault Coverage for Soft Errors. Asian Test Symposium 2005: 76-81 |
| 2004 | ||
| c21 | | Egor S. Sogomonyan, Daniel Marienfeld, Vitalij Ocheretnij, Michael Gössel: Self-checking Carry-selectAdder with Sum-bit Duplication. ARCS Workshops 2004: 84-91 |
| c20 | | Egor S. Sogomonyan, Daniel Marienfeld, Vitalij Ocheretnij, Michael Gössel: A New Self-Checking Sum-Bit Duplicated Carry-Select Adder. DATE 2004: 1360-1361 |
| c19 | | Vitalij Ocheretnij, Daniel Marienfeld, Egor S. Sogomonyan, Michael Gössel: Self-Checking Code-Disjoint Carry-Select Adder with Low Area Overhead by Use of Add1-Circuits. IOLTS 2004: 31-36 |
| 2003 | ||
| j5 | | Adit D. Singh, Markus Seuring, Michael Gössel, Egor S. Sogomonyan: Multimode scan: Test per clock BIST for IP cores. ACM Trans. Design Autom. Electr. Syst. 8(4): 491-505 (2003) |
| c18 | | Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan, Daniel Marienfeld: A Modulo p Checked Self-Checking Carry Select Adder. IOLTS 2003: 25-29 |
| c17 | | Kartik Mohanram, Egor S. Sogomonyan, Michael Gössel, Nur A. Touba: Synthesis of Low-Cost Parity-Based Partially Self-Checking Circuits. IOLTS 2003: 35- |
| 2002 | ||
| c16 | | Daniel Marienfeld, Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan: Partially Duplicated Code-Disjoint Carry-Skip Adder. DFT 2002: 78-86 |
| c15 | | Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel: A New Self-Checking Code-Disjoint Carry-Skip Adder. IOLTW 2002: 39-43 |
| c14 | | Michael Gössel, Egor S. Sogomonyan, Adit D. Singh: Scan-Path with Directly Duplicated and Inverted Duplicated Registers. VTS 2002: 47-52 |
| 2001 | ||
| c13 | | Vitalij Ocheretnij, Egor S. Sogomonyan, Michael Gössel: A New Code-Disjoint Sum-Bit Duplicated Carry Look-Ahead Adder for Parity Codes. Asian Test Symposium 2001: 365- |
| c12 | | Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan: Code-Disjoint Carry-Dependent Sum Adder with Partial Look-Ahead. IOLTW 2001: 147-152 |
| c11 | | Egor S. Sogomonyan, A. A. Morosov, Jan Rzeha, Michael Gössel, Adit D. Singh: Early Error Detection in Systems-on-Chip for Fault-Tolerance and At-Speed Debugging. VTS 2001: 184-189 |
| 1999 | ||
| j4 | | Egor S. Sogomonyan, Adit D. Singh, Michael Gössel: A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing. J. Electronic Testing 15(1-2): 87-96 (1999) |
| c10 | | Adit D. Singh, Egor S. Sogomonyan, Michael Gössel, Markus Seuring: Testability evaluation of sequential designs incorporating the multi-mode scannable memory element. ITC 1999: 286-293 |
| c9 | | Michael Gössel, A. A. Morosov, Egor S. Sogomonyan: A New Totally Error Propagating Compactor for Arbitrary Cores with Digital Interfaces. VTS 1999: 49-57 |
| 1998 | ||
| c8 | | Egor S. Sogomonyan, Adit D. Singh, Michael Gössel: A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing. VTS 1998: 324-331 |
| c7 | | Markus Seuring, Michael Gössel, Egor S. Sogomonyan: A Structural Approach for Space Compaction for Concurrent Checking and BIST. VTS 1998: 354-361 |
| 1997 | ||
| c6 | | Hendrik Hartje, Michael Gössel, Egor S. Sogomonyan: Code-Disjoint Circuits for Parity Circuits. Asian Test Symposium 1997: 100- |
| c5 | | Andrzej Hlawiczka, Michael Gössel, Egor S. Sogomonyan: A linear code-preserving signature analyzer COPMISR. VTS 1997: 350-355 |
| 1996 | ||
| j3 | | Michael Gössel, Egor S. Sogomonyan: A parity-preserving multi-input signature analyzer and its application for concurrent checking and BIST. J. Electronic Testing 8(2): 165-177 (1996) |
| j2 | | Sandip Kundu, Egor S. Sogomonyan, Michael Gössel, Steffen Tarnick: Self-Checking Comparator with One Periodic Output. IEEE Trans. Computers 45(3): 379-380 (1996) |
| c4 | | Egor S. Sogomonyan, Michael Gössel: Concurrently self-testing embedded checkers for ultra-reliable fault-tolerant systems. VTS 1996: 138-144 |
| 1994 | ||
| c3 | | Michael Gössel, Egor S. Sogomonyan: Code disjoint self-parity combinational circuits for self-testing, concurrent fault detection and parity scan design. VTS 1994: 151-157 |
| 1993 | ||
| j1 | | Egor S. Sogomonyan, Michael Gössel: Design of self-testing and on-line fault detection combinational circuits with weakly independent outputs. J. Electronic Testing 4(3): 267-281 (1993) |
| c2 |  | Egor S. Sogomonyan, Michael Gössel: Design of Self-Parity Combinational Circuits for Self-testing and On-line Detection. DFT 1993: 239-246 |
| c1 | | Michael Gössel, Egor S. Sogomonyan: Self-parity cominational circuits for self-testing, concurrent fault detection and parity scan design. VLSI 1993: 103-111 |
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