Ickhyun Song

Youngdon Choi, Ickhyun Song, Mu-Hui Park, Hoeju Chung, Sanghoan Chang, Beakhyoung Cho, Jinyoung Kim, Younghoon Oh, Dukmin Kwon, Jung Sunwoo, Junho Shin, Yoohwan Rho, Changsoo Lee, Min Gu Kang, Jaeyun Lee, Yongjin Kwon, Soehee Kim, Jaewhan Kim, Yong-jun Lee, Qi Wang, Sooho Cha, Sujin Ahn, Hideki Horii, Jaewook Lee, KiSeung Kim, Han-Sung Joo, KwangJin Lee, Yeong-Taek Lee, Jei-Hwan Yoo, Gitae Jeong: A 20nm 1.8V 8Gb PRAM with 40MB/s program bandwidth. ISSCC 2012: 46-48

Hoeju Chung, Byung-Hoon Jeong, ByungJun Min, Youngdon Choi, Beak-Hyung Cho, Junho Shin, Jinyoung Kim, Jung Sunwoo, Joon-min Park, Qi Wang, Yong-jun Lee, Sooho Cha, Dukmin Kwon, Sangtae Kim, Sunghoon Kim, Yoohwan Rho, Mu-Hui Park, Jaewhan Kim, Ickhyun Song, Sunghyun Jun, Jaewook Lee, KiSeung Kim, Ki-won Lim, Won-ryul Chung, ChangHan Choi, HoGeun Cho, Inchul Shin, Woochul Jun, Seokwon Hwang, Ki-Whan Song, KwangJin Lee, Sang-whan Chang, Woo-Yeong Cho, Jei-Hwan Yoo, Young-Hyun Jun: A 58nm 1.8V 1Gb PRAM with 6.4MB/s program BW. ISSCC 2011: 500-502

Jongwook Jeon, Ickhyun Song, Jong Duk Lee, Byung-Gook Park, Hyungcheol Shin: Application of the Compact Channel Thermal Noise Model of Short Channel MOSFETs to CMOS RFIC Design. IEICE Transactions 92-C(5): 627-634 (2009)

Hochul Lee, Youngchang Yoon, Ickhyun Song, Hyungcheol Shin: FN Stress Induced Degradation on Random Telegraph Signal Noise in Deep Submicron NMOSFETs. IEICE Transactions 91-C(5): 776-779 (2008)