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 | 1998 | |
|---|---|---|
| j2 |      | Lakshminarayana Pappu, Michael L. Bushnell, Vishwani D. Agrawal, Mandyam-Komar Srinivas: Statistical Delay Fault Coverage Estimation for Synchronous Sequential Circuits. J. Electronic Testing 12(3): 239-254 (1998) |
| 1997 | ||
| c7 | | Mandyam-Komar Srinivas, Michael L. Bushnell, Vishwani D. Agrawal: Flags and Algebra for Sequential Circuit VNR Path Delay Fault Test Generation. VLSI Design 1997: 88-94 |
| 1996 | ||
| j1 | | Mandyam-Komar Srinivas, James Jacob, Vishwani D. Agrawal: Functional test generation for synchronous sequential circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 15(7): 831-843 (1996) |
| c6 | | Lakshminarayana Pappu, Michael L. Bushnell, Vishwani D. Agrawal, Mandyam-Komar Srinivas: Statistical path delay fault coverage estimation for synchronous sequential circuits. VLSI Design 1996: 290-295 |
| 1995 | ||
| c5 | | Mandyam-Komar Srinivas, Vishwani D. Agrawal, Michael L. Bushnell: Functional test generation for path delay faults. Asian Test Symposium 1995: 339-345 |
| c4 | | Mandyam-Komar Srinivas, James Jacob, Vishwani D. Agrawal: Functional test generation for non-scan sequential circuits. VLSI Design 1995: 47-52 |
| 1994 | ||
| c3 |  | P. R. Suresh Kumar, James Jacob, Mandyam-Komar Srinivas, Vishwani D. Agrawal: An Improved Deductive Fault Simulator. VLSI Design 1994: 307-310 |
| 1993 | ||
| c2 | | P. R. Suresh Kumar, Mandyam-Komar Srinivas, James Jacob: Efficient Technique to Reduce Gate Evaluations and Speed Up Fault Simulation. VLSI Design 1993: 104 |
| 1992 | ||
| c1 | | Mandyam-Komar Srinivas, James Jacob, Vishwani D. Agrawal: Finite State Machine Testing Based on Growth and Dissappearance Faults. FTCS 1992: 238-245 |
| 1 | Vishwani D. Agrawal | |
| 2 | Michael L. Bushnell | |
| 3 | James Jacob | |
| 4 | P. R. Suresh Kumar | |
| 5 | Lakshminarayana Pappu |
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