Nik Sumikawa

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	2012
c7		Wen Chen, Nik Sumikawa, Li-C. Wang, Jayanta Bhadra, Xiushan Feng, Magdy S. Abadir: Novel test detection to improve simulation efficiency - A commercial experiment. ICCAD 2012: 101-108
c6		Vinayak Kamath, Wen Chen, Nik Sumikawa, Li-C. Wang: Functional test content optimization for peak-power validation - An experimental study. ITC 2012: 1-10
c5		Nik Sumikawa, Jeff Tikkanen, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir: Screening customer returns with multivariate test analysis. ITC 2012: 1-10
c4		Nik Sumikawa, Li-C. Wang, Magdy S. Abadir: An experiment of burn-in time reduction based on parametric test analysis. ITC 2012: 1-10
	2011
c3		Dragoljub Gagi Drmanac, Nik Sumikawa, LeRoy Winemberg, Li-C. Wang, Magdy S. Abadir: Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits. DATE 2011: 794-799
c2		Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir: Forward prediction based on wafer sort data - A case study. ITC 2011: 1-10
c1		Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir: Understanding customer returns from a test perspective. VTS 2011: 2-7

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