| 2012 | ||
|---|---|---|
| j5 | Ning Li, Keigo Bunsen, Naoki Takayama, Qinghong Bu, Toshihide Suzuki, Masaru Sato, Yoichi Kawano, Tatsuya Hirose, Kenichi Okada, Akira Matsuzawa: A 24 dB Gain 51-68 GHz Common Source Low Noise Amplifier Using Asymmetric-Layout Transistors. IEICE Transactions 95-A(2): 498-505 (2012) | |
| 2011 | ||
| j4 | Ning Li, Qinghong Bu, Kota Matsushita, Naoki Takayama, Shogo Ito, Kenichi Okada, Akira Matsuzawa: Topology and Design Considerations of 60 GHz CMOS LNAs for Noise Performance Improving. IEICE Transactions 94-C(12): 1881-1888 (2011) | |
| j3 | Kenichi Okada, Ning Li, Kota Matsushita, Keigo Bunsen, Rui Murakami, Ahmed Musa, Takahiro Sato, Hiroki Asada, Naoki Takayama, Shogo Ito, Win Chaivipas, Ryo Minami, Tatsuya Yamaguchi, Yasuaki Takeuchi, Hiroyuki Yamagishi, Makoto Noda, Akira Matsuzawa: A 60-GHz 16QAM/8PSK/QPSK/BPSK Direct-Conversion Transceiver for IEEE802.15.3c. J. Solid-State Circuits 46(12): 2988-3004 (2011) | |
| c3 | Kenichi Okada, Kota Matsushita, Keigo Bunsen, Rui Murakami, Ahmed Musa, Takahiro Sato, Hiroki Asada, Naoki Takayama, Ning Li, Shogo Ito, Win Chaivipas, Ryo Minami, Akira Matsuzawa: A 60GHz 16QAM/8PSK/QPSK/BPSK direct-conversion transceiver for IEEE 802.15.3c. ISSCC 2011: 160-162 | |
| 2010 | ||
| j2 | Ning Li, Kota Matsushita, Naoki Takayama, Shogo Ito, Kenichi Okada, Akira Matsuzawa: Evaluation of a Multi-Line De-Embedding Technique up to 110 GHz for Millimeter-Wave CMOS Circuit Design. IEICE Transactions 93-A(2): 431-439 (2010) | |
| j1 | Naoki Takayama, Kota Matsushita, Shogo Ito, Ning Li, Keigo Bunsen, Kenichi Okada, Akira Matsuzawa: A De-Embedding Method Using Different-Length Transmission Lines for mm-Wave CMOS Device Modeling. IEICE Transactions 93-C(6): 812-819 (2010) | |
| c2 | Naoki Takayama, Kota Matsushita, Shogo Ito, Ning Li, Kenichi Okada, Akira Matsuzawa: A 60GHz direct-conversion transmitter in 65nm CMOS technology. ASP-DAC 2010: 363-364 | |
| 1992 | ||
| c1 | Shuichi Kameyama, Hideyuki Ohara, Chihiro Endo, Naoki Takayama: Interconnect and Delay Testing with a 4800-Pin Board Tester. ITC 1992: 338-344 | |
Colors in the list of coauthors
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