Xinghai Tang

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	1997
j1		Xinghai Tang, Vivek De, James D. Meindl: Intrinsic MOSFET parameter fluctuations due to random dopant placement. IEEE Trans. VLSI Syst. 5(4): 369-376 (1997)
	1996
c1		Xinghai Tang, Vivek De, James D. Meindl: Effects of random MOSFET parameter fluctuations on total power consumption. ISLPED 1996: 233-236

Coauthor Index

1	Vivek De (Vivek K. De)	[j1] [c1]
2	James D. Meindl	[j1] [c1]

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