João Paulo Teixeira

Jackson Pachito, Celestino V. Martins, B. Jacinto, Jorge Semião, Julio César Vázquez, Víctor H. Champac, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Aging-Aware Power or Frequency Tuning With Predictive Fault Detection. IEEE Design & Test of Computers 29(5): 27-36 (2012)

Judit Freijedo, Jorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira: Modeling the Effect of Process, Power-Supply Voltage and Temperature Variations on the Timing Response of Nanometer Digital Circuits. J. Electronic Testing 28(4): 421-434 (2012)

Jackson Pachito, Celestino V. Martins, Jorge Semião, Marcelino Bicho Dos Santos, Isabel C. Teixeira, João Paulo Teixeira: The influence of clock-gating on NBTI-induced delay degradation. IOLTS 2012: 61-66

Judit Freijedo, María Dolores Valdés, Lucía Costas, María José Moure, Juan J. Rodríguez-Andina, Jorge Semião, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira: Lower V_DD Operation of FPGA-Based Digital Circuits Through Delay Modeling and Time Borrowing. J. Low Power Electronics 7(2): 185-198 (2011)

R. S. Oliveira, Jorge Semião, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira: On-Line BIST for Performance Failure Prediction Under NBTI-Induced Aging in Safety-Critical Applications. J. Low Power Electronics 7(4): 562-572 (2011)

Vasco Bexiga, Carlos Leong, Jorge Semião, Isabel C. Teixeira, João Paulo Teixeira, María Dolores Valdés, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas: Performance Failure Prediction Using Built-In Delay Sensors in FPGAs. FPL 2011: 301-304

João Paulo Teixeira, Vanda Lopes: Help system for medical diagnosis of the electrocardiogram. SeGAH 2011: 1-8

Celestino V. Martins, Jorge Semião, Julio César Vázquez, Víctor H. Champac, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Adaptive Error-Prediction Flip-flop for performance failure prediction with aging sensors. VTS 2011: 203-208

Judit Freijedo, Lucía Costas, Jorge Semião, Juan J. Rodríguez-Andina, María José Moure, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira: Impact of Power Supply Voltage Variations on FPGA-Based Digital Systems Performance. J. Low Power Electronics 6(2): 339-349 (2010)

Julio César Vázquez, Víctor H. Champac, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira: Programmable aging sensor for automotive safety-critical applications. DATE 2010: 618-621

Carlos Leong, Pedro Machado, Vasco Bexiga, João Paulo Teixeira, Isabel C. Teixeira, J. C. Silva, Pedro Lousã, João Varela: Built-in Clock Domain Crossing (CDC) test and diagnosis in GALS systems. DDECS 2010: 72-77

Julio César Vázquez, Víctor H. Champac, Adriel Ziesemer, Ricardo Reis, Jorge Semião, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira: Predictive error detection by on-line aging monitoring. IOLTS 2010: 9-14

Carlos Leong, João Paulo Teixeira, Isabel C. Teixeira, R. Bugalho, Manuel Ferreira, Pedro Rodrigues, J. C. Silva, Pedro Lousã, João Varela: Automatic Configuration of a Medical Imaging System to Unknown Delays in Synchronous Input Data Channels. ISCAS 2010: 1185-1188

Julio César Vázquez, Víctor H. Champac, Adriel Ziesemer, Ricardo Reis, Isabel Maria Cacho Teixeira, Marcelino B. Santos, João Paulo Teixeira: Low-sensitivity to process variations aging sensor for automotive safety-critical applications. VTS 2010: 238-243

Carlos Leong, Pedro Machado, Vasco Bexiga, João Paulo Teixeira, Isabel C. Teixeira, Joel Rego, Pedro Neves, Fernando Piedade, Pedro Lousã, Pedro Rodrigues, Andreia Trindade, R. Bugalho, J. F. Pinheiro, Manuel Ferreira, João Varela: Data Acquisition Electronics for PET Mammography Imaging. BIODEVICES 2009: 192-197

E. Albuquerque, Vasco Bexiga, R. Bugalho, B. Carriço, C. S. Ferreira, Manuel Ferreira, J. Godinho, Fernando M. Gonçalves, Carlos Leong, Pedro Lousã, Pedro Machado, R. Moura, Pedro Neves, C. Ortigão, Fernando Piedade, J. F. Pinheiro, P. Relvas, A. Rivetti, Pedro Rodrigues, J. C. Silva, M. M. Silva, Isabel C. Teixeira, João Paulo Teixeira, Andreia Trindade, João Varela: On-Detector Electronics of the Clear PEM Scanner. BIODEVICES 2009: 355-358

Julio César Vázquez, Víctor H. Champac, Adriel Ziesemer, Ricardo Reis, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira: Built-in aging monitoring for safety-critical applications. IOLTS 2009: 9-14

Jose Rocha, Nuno Dias, Angelo Monteiro, Alexandre Neves, Gabriel Santos, Marcelino B. Santos, João Paulo Teixeira: Controllability and observability in mixed signal cores. IOLTS 2009: 198-200

Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Delay-fault tolerance to power supply Voltage disturbances analysis in nanometer technologies. IOLTS 2009: 223-228

Jorge Semião, Marcial Jesús Rodríguez-Irago, Juan J. Rodríguez-Andina, Leonardo Bisch Piccoli, Fabian Vargas, Marcelino Bicho Dos Santos, Isabel Maria Cacho Teixeira, João Paulo Teixeira: Signal Integrity Enhancement in Digital Circuits. IEEE Design & Test of Computers 25(5): 452-461 (2008)

Alex Bystrov, João Paulo Teixeira: Selected Peer-Reviewed Articles from the LPonTR 2008 Workshop. J. Low Power Electronics 4(3): 372-373 (2008)

Jorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Process Tolerant Design Using Thermal and Power-Supply Tolerance in Pipeline Based Circuits. DDECS 2008: 34-37

Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Exploiting Parametric Power Supply and/or Temperature Variations to Improve Fault Tolerance in Digital Circuits. IOLTS 2008: 227-232

Marcelino B. Santos, João Paulo Teixeira: Functional-oriented mask-based built-in self-test. IET Computers & Digital Techniques 1(5): 491-498 (2007)

Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Improving Tolerance to Power-Supply and Temperature Variations in Synchronous Circuits. DDECS 2007: 295-300

Jorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino Bicho Dos Santos, Isabel C. Teixeira, João Paulo Teixeira: Improving the Tolerance of Pipeline Based Circuits to Power Supply or Temperature Variations. DFT 2007: 303-311

Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: On-line Dynamic Delay Insertion to Improve Signal Integrity in Synchronous Circuits. IOLTS 2007: 167-172

Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Enhancing the Tolerance to Power-Supply Instability in Digital Circuits. ISVLSI 2007: 207-212

José M. Fernandes, Marcelino B. Santos, Arlindo L. Oliveira, João Paulo Teixeira: Probabilistic Testability Analysis and DFT Methods at RTL. DDECS 2006: 216-217

F. Guerreiro, Jorge Semião, A. Pierce, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Functional-Oriented BIST of Sequential Circuits Aiming at Dynamic Faults Coverage. DDECS 2006: 279-284

Marcial Jesús Rodríguez-Irago, Juan J. Rodríguez-Andina, Fabian Vargas, Jorge Semião, Isabel C. Teixeira, João Paulo Teixeira: Dynamic Fault Detection in Digital Systems Using Dynamic Voltage Scaling and Multi-Temperature Schemes. IOLTS 2006: 257-262

D. Barros Júnior, Marcial Jesús Rodríguez-Irago, Marcelino B. Santos, Isabel C. Teixeira, Fabian Vargas, João Paulo Teixeira: Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip. J. Electronic Testing 21(4): 349-363 (2005)

Carlos Leong, P. Bento, Pedro Rodrigues, Andreia Trindade, J. C. Silva, Pedro Lousã, Joel Rego, J. Nobre, João Varela, João Paulo Teixeira, Isabel C. Teixeira: Design and Test Methodology for a Reconfigurable PEM Data Acquisition Electronics System. FPL 2005: 523-526

João Paulo Teixeira, Diamantino Freitas, Hiroya Fujisaki: Evaluation of a system for F0 contour prediction for european Portuguese. INTERSPEECH 2005: 3249-3252

Marcial Jesús Rodríguez-Irago, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Dynamic Fault Test and Diagnosis in Digital Systems Using Multiple Clock Schemes and Multi-VDD Test. IOLTS 2005: 281-286

Abilio Parreira, João Paulo Teixeira, Marcelino B. Santos: Built-In Self-Test Quality Assessment Using Hardware Fault Emulation In FPGAs. Computers and Artificial Intelligence 23(5): 537-556 (2004)

Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira, Salvador Manich, L. Balado, Joan Figueras: On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level. J. Electronic Testing 20(4): 345-355 (2004)

José M. Fernandes, Marcelino B. Santos, Arlindo L. Oliveira, João Paulo Teixeira: A Probabilistic Method for the Computation of Testability of RTL Constructs. DATE 2004: 176-181

Abilio Parreira, João Paulo Teixeira, Marcelino B. Santos: FPGAs BIST Evaluation. FPL 2004: 333-343

Daniel Barros Jr., Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Modeling and Simulation of Time Domain Faults in Digital Systems. IOLTS 2004: 5-10

Marcelino B. Santos, José M. Fernandes, Isabel C. Teixeira, João Paulo Teixeira: RTL Test Pattern Generation for High Quality Loosely Deterministic BIST. DATE 2003: 10994-10999

Rui Ribeiro, Octávio Páscoa Dias, João Paulo Teixeira, Isabel C. Teixeira: Hardware/software solution for the automation and real-time control of a wine bottling production line. ETFA (1) 2003: 110-115

Abilio Parreira, João Paulo Teixeira, A. Pantelimon, Marcelino B. Santos, José T. de Sousa: Fault Simulation Using Partially Reconfigurable Hardware. FPL 2003: 839-848

João Paulo Teixeira, Diamantino Freitas: Segmental durations predicted with a neural network. INTERSPEECH 2003

João Paulo Teixeira, Diamantino Freitas, Hiroya Fujisaki: Prediction of fujisaki model's phrase commands. INTERSPEECH 2003

Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Property Coverage for Quality Assessment of Fault Tolerant or Fail Safe Systems. IOLTS 2003: 164-165

João Paulo Teixeira, Diamantino Freitas: Evaluation of a Segmental Durations Model for TTS. PROPOR 2003: 40-48

Daniela Braga, Diamantino Freitas, João Paulo Teixeira, Aldina Marques: On the Use of Prosodic Labelling in Corpus-Based Linguistic Studies of Spontaneous Speech. TSD 2003: 388-393

Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira: RTL Design Validation, DFT and Test Pattern Generation for High Defects Coverage. J. Electronic Testing 18(2): 179-187 (2002)

Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Design and Test of a Certifiable ASIC for a Safety-Critical Gas Burner Control System. J. Electronic Testing 18(3): 285-294 (2002)

Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Self-Checking and Fault Tolerance Quality Assessment Using Fault Sampling. DFT 2002: 216-224

Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira, Salvador Manich, Rosa Rodríguez-Montañés, Joan Figueras: RTL Level Preparation of High-Quality/Low-Energy/Low-Power BIST. ITC 2002: 814-823

Diamantino Freitas, António Moura, Daniela Braga, Helder Ferreira, João Paulo Teixeira, Maria João Barros, Paulo Gouveia, Vagner Latsch: A Project of Speech Input and Output in an E-commerce Application. PorTAL 2002: 141-150

Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira: RTL-Based Functional Test Generation for High Defects Coverage in Digital Systems. J. Electronic Testing 17(3-4): 311-319 (2001)

Yervant Zorian, Paolo Prinetto, João Paulo Teixeira, Isabel C. Teixeira, Carlos Eduardo Pereira, Octávio Páscoa Dias, Jorge Semião, Peter Muhmenthaler, W. Radermacher: Embedded tutorial: TRP: integrating embedded test and ATE. DATE 2001: 34-37

Hugo Lérias, João Luz, Pedro Moura, Ana Mendes, Isabel C. Teixeira, João Paulo Teixeira: Towards E-Management as Enabler for Accelerated Change. ICEIS (2) 2001: 807-814

João Paulo Teixeira, Diamantino Freitas, Daniela Braga, Maria João Barros, Vagner Latsch: Phonetic events from the labeling the european portuguese database for speech synthesis, FEUP/IPBDB. INTERSPEECH 2001: 1707-1710

Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Design and Test of Certifiable ASICs for Safety-Critical Gas Burners Contro. IOLTW 2001: 197-201

Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Implicit functionality and multiple branch coverage (IFMB): a testability metric for RT-level. ITC 2001: 377-385

Octávio Páscoa Dias, Isabel C. Teixeira, João Paulo Teixeira, Leandro Buss Becker, Carlos Eduardo Pereira: Optimizing Functional distribution in Complex System Design. DIPES 2000: 75-86

Leandro Buss Becker, Carlos Eduardo Pereira, Octávio Páscoa Dias, Isabel C. Teixeira, João Paulo Teixeira: MOSYS A Methodology for Automatic Object Identification from System Specification. ISORC 2000: 198-201

Octávio Páscoa Dias, Jorge Semião, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Quality of Electronic Design: From Architectural Level to Test Coverage. ISQED 2000: 197-

Octávio Páscoa Dias, Isabel C. Teixeira, João Paulo Teixeira: Metrics and Criteria for Quality Assessment of Testable Hw/Sw Systems Architectures. J. Electronic Testing 14(1-2): 149-158 (1999)

Fernando M. Gonçalves, João Paulo Teixeira: Defect-Oriented Sampling of Non-Equally Probable Faults in VLSI Systems. J. Electronic Testing 15(1-2): 41-52 (1999)

Marcelino B. Santos, João Paulo Teixeira: Defect-Oriented Mixed-Level Fault Simulation of Digital Systems-on-a-Chip Using HDL. DATE 1999: 549-

Márcio N. de Souza, E. J. Caprini, Glaucio J. Couri Machado, M. V. Ludolf, Luiz Pereira Calôba, José Manoel de Seixas, Fernando Gil Resende, Sergio L. Netto, Diamantino Rui da Silva Freitas, João Paulo Teixeira, Carlos Espain, Vitor Pera, F. Moreira: Developing a voiced information retrieval system for the portuguese language capable to handle both brazilian and portuguese spoken versions. EUROSPEECH 1999

João Paulo Teixeira, Elisabete Rosa Paulo, Diamantino Freitas, Maria da Graca Pinto: Acoustical characterisation of the accented syllable in portuguese, a contribution to the naturalness of speech synthesis. EUROSPEECH 1999

Fernando M. Gonçalves, João Paulo Teixeira: Teaching Microelectronic-Based Integrated Systems Design and Test. MSE 1999: 65-66

Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira: Defect-Oriented Verilog Fault Simulation of SoC Macros using a Stratified Fault Sampling Technique. VTS 1999: 326-332

Octávio Páscoa Dias, Isabel C. Teixeira, João Paulo Teixeira, Carlos Eduardo Pereira: An OO Based Methodology for Real-Time HW/SW Systems Modeling. DIPES 1998: 213-222

Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Defect-oriented test quality assessment using fault sampling and simulation. ITC 1998: 35-42

Fernando M. Gonçalves, João Paulo Teixeira: Sampling Techniques of Non-Equally Probable Faults in VLSI System. VTS 1998: 283-288

Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira: Realistic Fault Extraction for High-Quality Design and Test of VLSI Systems. DFT 1997: 29-37

José T. de Sousa, Fernando M. Gonçalves, João Paulo Teixeira, Cristoforo Marzocca, Francesco Corsi, Thomas W. Williams: Defect level evaluation in an IC design environment. IEEE Trans. on CAD of Integrated Circuits and Systems 15(10): 1286-1293 (1996)

F. Celeiro, L. Dias, J. Ferreira, Marcelino B. Santos, João Paulo Teixeira: Defect-Oriented IC Test and Diagnosis Using VHDL Fault Simulation. ITC 1996: 620-628

Marcelino B. Santos, M. Simões, Isabel C. Teixeira, João Paulo Teixeira: Test preparation for high coverage of physical defects in CMOS digital ICs. VTS 1995: 330-337

Antonio Casimiro, Fernando M. Gonçalves, João Paulo Teixeira, Marcelino B. Santos: On the Analysis of Routing Cells and Adjacency Faults in CMOS Digital Circuits. DFT 1994: 263-270

José T. de Sousa, Fernando M. Gonçalves, João Paulo Teixeira, Thomas W. Williams: Fault Modeling and Defect Level Projections in Digital ICs. EDAC-ETC-EUROASIC 1994: 436-442

M. Calha, Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira: Back Annotation of Physical Defects into Gate-Level, Realistic Faults in Digital ICs. ITC 1994: 720-728

Antonio Casimiro, M. Simões, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Experiments on Bridging Fault Analysis and Layout-Level DFT for CMOS Designs. DFT 1993: 109-116

P. Nicolau, J. Barbosa, M. Saraiva, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Realistic Fault Analysis of CMOS Analog Building Blocks. DFT 1993: 311-318

M. Saraiva, Marcelino B. Santos, Antonio Casimiro, Isabel Maria Cacho Teixeira, João Paulo Teixeira: On the design of a highly testable cell library. Microprocessing and Microprogramming 35(1-5): 383-389 (1992)

M. Saraiva, P. Casimiro, Marcelino B. Santos, José T. de Sousa, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira: Physical DFT for High Coverage of Realistic Faults. ITC 1992: 642-651

João Paulo Teixeira, Isabel C. Teixeira, C. F. Beltrá Almeida, Fernando M. Gonçalves, J. Gonçalves: A methodology for testability enhancement at layout level. J. Electronic Testing 1(4): 287-299 (1991)

José T. de Sousa, Fernando M. Gonçalves, João Paulo Teixeira: IC Defects-Based Testability Analysis. ITC 1991: 500-509

João Paulo Teixeira, Isabel C. Teixeira, C. F. Beltrá Almeida, Fernando M. Gonçalves, J. Gonçalves, R. Crespo: A strategy for testability enhancement at layout level. EURO-DAC 1990: 413-417