Eiichi Teraoka

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	1993
c2		Eiichi Teraoka, Toru Kengaku, Ikuo Yasui, Kazuyuki Ishikawa, Takahiro Matsuo, Hideyuki Wakada, Narumi Sakashita, Yukihiko Shimazu, Takeshi Tokuda: A Built-in Self- Test for ADC and DAC in a Single-Chip Speech CODEC. ITC 1993: 791-796
	1990
c1		Narumi Sakashita, Hisako Sawai, Eiichi Teraoka, Toshiki Fugiyama, Toru Kengaku, Yukihiko Shimazu, Takeshi Tokuda: Built-in self-test in a 24 bit floating point digital signal processor. ITC 1990: 880-885

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