Gerd Teschke

Matthias Rätsch, Clemens Blumer, Thomas Vetter, Gerd Teschke: Efficient object tracking by condentional and cascaded image sensing. Computer Standards & Interfaces 34(6): 549-557 (2012)

Stephan Dahlke, Sören Häuser, Gerd Teschke: Coorbit Space Theory for the Toeplitz Shearlet Transform. IJWMIP 10(4) (2012)

Stephan Dahlke, Michael Elad, Yonina C. Eldar, Gitta Kutyniok, Gerd Teschke: Sparse Representations and Efficient Sensing of Data (Dagstuhl Seminar 11051). Dagstuhl Reports 1(1): 108-127 (2011)

Massimo Fornasier, Ronny Ramlau, Gerd Teschke: The application of joint sparsity and total variation minimization algorithms to a real-life art restoration problem. Adv. Comput. Math. 31(1-3): 157-184 (2009)

Stephan Dahlke, Gerd Teschke, Krunoslav Stingl: Coorbit Theory, Multi-α-Modulation Frames, and the Concept of Joint Sparsity for Medical Multichannel Data Analysis. EURASIP J. Adv. Sig. Proc. 2008 (2008)

Stephan Dahlke, Gitta Kutyniok, Peter Maass, Chen Sagiv, Hans-Georg Stark, Gerd Teschke: The Uncertainty Principle Associated with the Continuous Shearlet Transform. IJWMIP 6(2): 157-181 (2008)

Matthias Rätsch, Gerd Teschke, Sami Romdhani, Thomas Vetter: Wavelet Frame Accelerated Reduced Support Vector Machines. IEEE Transactions on Image Processing 17(12): 2456-2464 (2008)

Gerd Teschke: Construction of Generalized Uncertainty Principles and Wavelets in Anisotropic Sobolev Spaces. IJWMIP 3(2): 189-209 (2005)

Matthias Rätsch, Sami Romdhani, Gerd Teschke, Thomas Vetter: Over-Complete Wavelet Approximation of a Support Vector Machine for Efficient Classification. DAGM-Symposium 2005: 351-360

Stephan Dahlke, Gabriele Steidl, Gerd Teschke: Coorbit Spaces and Banach Frames on Homogeneous Spaces with Applications to the Sphere. Adv. Comput. Math. 21(1-2): 147-180 (2004)

Stephan Dahlke, Peter Maass, Gerd Teschke: Reconstruction of Wideband Reflectivity Densities by Wavelet Transforms. Adv. Comput. Math. 18(2-4): 189-209 (2003)

Peter Maass, Gerd Teschke, Werner Willmann, Günter Wollmann: Detection and classification of material attributes-a practical application of wavelet analysis. IEEE Transactions on Signal Processing 48(8): 2432-2438 (2000)