Steven Thijs

Vojkan Vidojkovic, Giovanni Mangraviti, Khaled Khalaf, Viki Szortyka, Kristof Vaesen, Wim Van Thillo, Bertrand Parvais, Mike Libois, Steven Thijs, John R. Long, Charlotte Soens, Piet Wambacq: A low-power 57-to-66GHz transceiver in 40nm LP CMOS with -17dB EVM at 7Gb/s. ISSCC 2012: 268-270

Geert Van der Plas, Paresh Limaye, Igor Loi, Abdelkarim Mercha, Herman Oprins, Cristina Torregiani, Steven Thijs, Dimitri Linten, Michele Stucchi, Guruprasad Katti, Dimitrios Velenis, Vladimir Cherman, Bart Vandevelde, Veerle Simons, Ingrid De Wolf, Riet Labie, Dan Perry, Stephane Bronckers, Nikolaos Minas, Miro Cupac, Wouter Ruythooren, Jan Van Olmen, Alain Phommahaxay, Muriel de Potter de ten Broeck, Ann Opdebeeck, Michal Rakowski, Bart De Wachter, Morin Dehan, Marc Nelis, Rahul Agarwal, Antonio Pullini, Federico Angiolini, Luca Benini, Wim Dehaene, Youssef Travaly, Eric Beyne, Paul Marchal: Design Issues and Considerations for Low-Cost 3-D TSV IC Technology. J. Solid-State Circuits 46(1): 293-307 (2011)

Geert Van der Plas, Steven Thijs, Dimitri Linten, Guruprasad Katti, Paresh Limaye, Abdelkarim Mercha, Michele Stucchi, Herman Oprins, Bart Vandevelde, Nikolaos Minas, Miro Cupac, Morin Dehan, Marc Nelis, Rahul Agarwal, Wim Dehaene, Youssef Travaly, Eric Beyne, Paul Marchal: Verifying electrical/thermal/thermo-mechanical behavior of a 3D stack - Challenges and solutions. CICC 2010: 1-4

Geert Van der Plas, Paresh Limaye, Abdelkarim Mercha, Herman Oprins, Cristina Torregiani, Steven Thijs, Dimitri Linten, Michele Stucchi, Guruprasad Katti, Dimitrios Velenis, Domae Shinichi, Vladimir Cherman, Bart Vandevelde, Veerle Simons, Ingrid De Wolf, Riet Labie, Dan Perry, Stephane Bronckers, Nikolaos Minas, Miro Cupac, Wouter Ruythooren, Jan Van Olmen, Alain Phommahaxay, Muriel de Potter de ten Broeck, Ann Opdebeeck, Michal Rakowski, Bart De Wachter, Morin Dehan, Marc Nelis, Rahul Agarwal, Wim Dehaene, Youssef Travaly, Pol Marchal, Eric Beyne: Design issues and considerations for low-cost 3D TSV IC technology. ISSCC 2010: 148-149

Dimitri Linten, Steven Thijs, Jonathan Borremans, Morin Dehan, D. Trémouilles, Mirko Scholz, M. I. Natarajan, Piet Wambacq, Stefaan Decoutere, Guido Groeseneken: A plug-and-play wideband RF circuit ESD protection methodology: T-diodes. Microelectronics Reliability 49(12): 1440-1446 (2009)

Mirko Scholz, Dimitri Linten, Steven Thijs, Sandeep Sangameswaran, Masanori Sawada, Toshiyuki Nakaei, Takumi Hasebe, Guido Groeseneken: ESD On-Wafer Characterization: Is TLP Still the Right Measurement Tool? IEEE T. Instrumentation and Measurement 58(10): 3418-3426 (2009)

Kuba Raczkowski, Steven Thijs, Walter De Raedt, Bart Nauwelaers, Piet Wambacq: 50-to-67GHz ESD-protected power amplifiers in digital 45nm LP CMOS. ISSCC 2009: 382-383

D. Trémouilles, Steven Thijs, Philippe Roussel, M. I. Natarajan, Vesselin K. Vassilev, Guido Groeseneken: Transient voltage overshoot in TLP testing - Real or artifact? Microelectronics Reliability 47(7): 1016-1024 (2007)

Steven Thijs, M. Natarajan Iyer, Dimitri Linten, Wutthinan Jeamsaksiri, T. Daenen, Robin Degraeve, Andries Scholten, Stefaan Decoutere, Guido Groeseneken: Implementation of plug-and-play ESD protection in 5.5GHz 90nm RF CMOS LNAs - Concepts, constraints and solutions. Microelectronics Reliability 46(5-6): 702-712 (2006)

Vesselin K. Vassilev, Steven Thijs, P. L. Segura, Piet Wambacq, Paul Leroux, Guido Groeseneken, M. I. Natarajan, H. E. Maes, Michiel Steyaert: ESD-RF co-design methodology for the state of the art RF-CMOS blocks. Microelectronics Reliability 45(2): 255-268 (2005)

Vesselin K. Vassilev, S. Jenei, Guido Groeseneken, R. Venegas, Steven Thijs, V. De Heyn, M. Natarajan Iyer, Michiel Steyaert, H. E. Maes: High frequency characterization and modelling of the parasitic RC performance of two terminal ESD CMOS protection devices. Microelectronics Reliability 43(7): 1011-1020 (2003)