Please note: This is a beta version of the new dblp website.
You can find the classic dblp view of this page here.
You can find the classic dblp view of this page here.
D. Trémouilles
David Trémouilles
2010 – today
- 2013
[j11]Nicolas Monnereau, Fabrice Caignet, David Trémouilles, Nicolas Nolhier, M. Bafleur: Building-up of system level ESD modeling: Impact of a decoupling capacitance on ESD propagation. Microelectronics Reliability 53(2): 221-228 (2013)- 2012
- [j10]Jinyu Ruan, Nicolas Monnereau, David Trémouilles, Nicolas Mauran, Fabio Coccetti, Nicolas Nolhier, Robert Plana: An Accelerated Stress Test Method for Electrostatically Driven MEMS Devices. IEEE T. Instrumentation and Measurement 61(2): 456-461 (2012)
2000 – 2009
- 2009
- [j9]M. Diatta, E. Bouyssou, D. Trémouilles, P. Martinez, F. Roqueta, O. Ory, M. Bafleur: Failure mechanisms of discrete protection device subjected to repetitive electrostatic discharges (ESD). Microelectronics Reliability 49(9-11): 1103-1106 (2009)
- [j8]Jinyu Ruan, Nicolas Nolhier, G. J. Papaioannou, D. Trémouilles, Vincent Puyal, C. Villeneuve, T. Idda, Fabio Coccetti, Robert Plana: Accelerated lifetime test of RF-MEMS switches under ESD stress. Microelectronics Reliability 49(9-11): 1256-1259 (2009)
- [j7]Dimitri Linten, Steven Thijs, Jonathan Borremans, Morin Dehan, D. Trémouilles, Mirko Scholz, M. I. Natarajan, Piet Wambacq, Stefaan Decoutere, Guido Groeseneken: A plug-and-play wideband RF circuit ESD protection methodology: T-diodes. Microelectronics Reliability 49(12): 1440-1446 (2009)
- 2007
- [j6]D. Trémouilles, Steven Thijs, Philippe Roussel, M. I. Natarajan, Vesselin K. Vassilev, Guido Groeseneken: Transient voltage overshoot in TLP testing - Real or artifact? Microelectronics Reliability 47(7): 1016-1024 (2007)
- 2005
- [j5]N. Guitard, F. Essely, D. Trémouilles, M. Bafleur, Nicolas Nolhier, Philippe Perdu, André Touboul, Vincent Pouget, Dean Lewis: Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. Microelectronics Reliability 45(9-11): 1415-1420 (2005)
- 2003
- [j4]D. Trémouilles, G. Bertrand, M. Bafleur, Felix Beaudoin, Philippe Perdu, N. Guitard, L. Lescouzères: TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology. Microelectronics Reliability 43(1): 71-79 (2003)
- [j3]T. Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, M. Bafleur, D. Trémouilles: Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. Microelectronics Reliability 43(3): 439-444 (2003)
- [j2]T. Beauchêne, D. Trémouilles, Dean Lewis, Philippe Perdu, Pascal Fouillat: Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS). Microelectronics Reliability 43(9-11): 1577-1582 (2003)
- 2001
- [j1]Romain Desplats, Felix Beaudoin, Philippe Perdu, P. Poirier, D. Trémouilles, M. Bafleur, Dean Lewis: Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation. Microelectronics Reliability 41(9-10): 1539-1544 (2001)
Coauthor Index
data released under the ODC-BY 1.0 license. See also our legal information page
last updated on 2013-04-12 20:34 CEST by the dblp team