Han-Chang Tsai: Reliable study of time- and frequency-domain EMI-induced noise in Wien bridge oscillator.Microelectronics Reliability 52(11): 2647-2654 (2012)
Han-Chang Tsai: Numerical and experimental analysis of EMI effects on circuits with MESFET devices.Microelectronics Reliability 48(4): 537-546 (2008)
2007
[j3]
Han-Chang Tsai: An investigation on the influence of electromagnetic interference induced in conducting wire of universal LEDs.Microelectronics Reliability 47(6): 959-966 (2007)
2005
[j2]
Han-Chang Tsai: Investigation of electromagnetic radiation induced by conducting wire of nanometer multi-quantum well device on InGaN LED.Microelectronics Journal 36(8): 712-717 (2005)
2003
[j1]
Han-Chang Tsai: Reliable study of digital IC circuits with margin voltage among variable DC power supply, electromagnetic interference and conducting wire antenna.Microelectronics Reliability 43(12): 2001-2009 (2003)
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