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 | 2012 | |
|---|---|---|
| j2 |      | A. S. Petrov, V. N. Ulimov: Some features of degradation in bipolar transistors at different test conditions for total ionizing dose effect. Microelectronics Reliability 52(9-10): 2435-2437 (2012) |
| 2002 | ||
| j1 | | V. S. Pershenkov, S. V. Avdeev, A. S. Tsimbalov, M. N. Levin, V. V. Belyakov, D. V. Ivashin, A. Y. Slesarev, A. Y. Bashin, G. I. Zebrev, V. N. Ulimov: Use of preliminary ultraviolet and infrared illumination for diagnostics of MOS and bipolar devices radiation response. Microelectronics Reliability 42(4-5): 797-804 (2002) |
| 1 | S. V. Avdeev | |
| 2 | A. Y. Bashin | |
| 3 | V. V. Belyakov | |
| 4 | D. V. Ivashin | |
| 5 | M. N. Levin | |
| 6 | V. S. Pershenkov | |
| 7 | A. S. Petrov | |
| 8 | A. Y. Slesarev | |
| 9 | A. S. Tsimbalov | |
| 10 | G. I. Zebrev |
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