M. Ullán Coauthor index pubzone.org

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DBLP keys2012
j3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
P. Fernández-Martínez, F. R. Palomo, S. Díez, Salvador Hidalgo, M. Ullán, D. Flores, Roland Sorge: Simulation methodology for dose effects in lateral DMOS transistors. Microelectronics Journal 43(1): 50-56 (2012)
2006
j2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
M. Ullán, M. Lozano, M. Chmeissani, G. Blanchot, Enric Cabruja, J. García, M. Maiorino, R. Martínez, G. Pellegrini, C. Puigdengoles: Test structure assembly for bump bond yield measurement on high density flip chip technologies. Microelectronics Reliability 46(7): 1095-1100 (2006)
2002
j1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XML
J. M. Rafí, B. Vergnet, F. Campabadal, C. Fleta, L. Fonseca, M. Lozano, C. Martínez, M. Ullán: Electrical characteristics of high-energy proton irradiated ultra-thin gate oxides. Microelectronics Reliability 42(9-11): 1501-1504 (2002)

Coauthor Index

1G. Blanchot
[j2]
2Enric Cabruja
[j2]
3F. Campabadal
[j1]
4M. Chmeissani
[j2]
5S. Díez
[j3]
6P. Fernández-Martínez
[j3]
7C. Fleta
[j1]
8D. Flores
[j3]
9L. Fonseca
[j1]
10J. García
[j2]
11Salvador Hidalgo
[j3]
12M. Lozano
[j2] [j1]
13M. Maiorino
[j2]
14C. Martínez
[j1]
15R. Martínez
[j2]
16F. R. Palomo
[j3]
17G. Pellegrini
[j2]
18C. Puigdengoles
[j2]
19J. M. Rafí
[j1]
20Roland Sorge
[j3]
21B. Vergnet
[j1]

Colors in the list of coauthors

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