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Josep Rius Vázquez
Josep Rius
2010 – today
- 2013
[j5]Josep Rius: IR-Drop in On-Chip Power Distribution Networks of ICs With Nonuniform Power Consumption. IEEE Trans. VLSI Syst. 21(3): 512-522 (2013)- 2010
- [c11]
2000 – 2009
- 2009
- [c10]Josep Rius, Luis Elvira Villagra, Maurice Meijer: A Voltage-Mode Testing Method to Detect IDDQ Defects in Digital Circuits. European Test Symposium 2009: 135-140
- [c9]Pablo Maqueda, Josep Rius: Analysis of the extra delay on interconnects caused by resistive opens and shorts. IOLTS 2009: 208-209
- 2006
- [j4]Josep Rius, Maurice Meijer, José Pineda de Gyvez: An Activity Monitor for Power/Performance Tuning of CMOS Digital Circuits. J. Low Power Electronics 2(1): 80-86 (2006)
- 2005
- [c8]Josep Rius, José Pineda de Gyvez, Maurice Meijer: An Activity Monitor for Power/Performance Tuning of CMOS Digital Circuits. PATMOS 2005: 187-196
- 2004
- [c7]Josep Rius Vázquez, José Pineda de Gyvez: Power Supply Noise Monitor for Signal Integrity Faults. DATE 2004: 1406-1407
- [c6]Josep Rius Vázquez, José Pineda de Gyvez: Built-in Current Sensor for ?I{DDQ} Testing of Deep Submicron Digital CMOS ICs. VTS 2004: 53-58
- [c5]Salvador Manich, L. García, L. Balado, Emili Lupon, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras: BIST Technique by Equally Spaced Test Vector Sequences. VTS 2004: 206-216
- 2003
- [c4]Josep Rius, Alejandro Peidro, Salvador Manich, Rosa Rodriguez-Sánchez: Power and Energy Consumption of CMOS Circuits: Measurement Methods and Experimental Results. PATMOS 2003: 80-89
- 2002
- [c3]Bram Kruseman, Stefan van den Oetelaar, Josep Rius: Comparison of IDDQ Testing and Very-Low Voltage Testing. ITC 2002: 964-973
1990 – 1999
- 1999
- [c2]Josep Rius, Joan Figueras: Exploring the Combination of IDDQ and iDDt Testing: Energy Testing. DATE 1999: 543-548
- 1998
- [j3]Antoni Ferré, Eugeni Isern, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras: IDDQ testing: state of the art and future trends. Integration 26(1-2): 167-196 (1998)
- 1996
- [j2]Josep Rius, Joan Figueras: Dynamic characterization of Built-In Current Sensors based on PN junctions: Analysis and experiments. J. Electronic Testing 9(3): 295-310 (1996)
- 1995
- [c1]Josep Rius, Joan Figueras: Detecting I/sub DDQ/ defective CMOS circuits by depowering. VTS 1995: 324-329
- 1992
- [j1]Josep Rius, Joan Figueras: Proportional BIC sensor for current testing. J. Electronic Testing 3(4): 387-396 (1992)
Coauthor Index
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last updated on 2013-02-26 20:15 CET by the dblp team