Gerd Vandersteen

Johan Schoukens, Gerd Vandersteen, Rik Pintelon, Zlatko Emedi, Yves Rolain: Bounding the Polynomial Approximation Errors of Frequency Response Functions. IEEE T. Instrumentation and Measurement 62(5): 1346-1353 (2013)

Diana Ugryumova, Gerd Vandersteen, Bart Huyck, Filip Logist, Jan F. M. Van Impe, Bart De Moor: Identification of a Noninsulated Distillation Column From Transient Response Data. IEEE T. Instrumentation and Measurement 62(5): 1382-1391 (2013)

Johan Schoukens, Gerd Vandersteen, Yves Rolain, Rik Pintelon: Frequency Response Function Measurements Using Concatenated Subrecords With Arbitrary Length. IEEE T. Instrumentation and Measurement 61(10): 2682-2688 (2012)

Benjamin Sanchez, Johan Schoukens, Ramon Bragós, Gerd Vandersteen: Novel Estimation of the Electrical Bioimpedance Using the Local Polynomial Method. Application to In Vivo Real-Time Myocardium Tissue Impedance Characterization During the Cardiac Cycle. IEEE Trans. Biomed. Engineering 58(12): 3376-3385 (2011)

Kurt Barbé, Rik Pintelon, Gerd Vandersteen: Finite Record Effects of the Errors-in-Variables Estimator for Linear Dynamic Systems. IEEE T. Instrumentation and Measurement 60(2): 642-654 (2011)

Johan Schoukens, Yves Rolain, Gerd Vandersteen, Rik Pintelon: User friendly Box-Jenkins identification using nonparametric noise models. CDC-ECE 2011: 2148-2153

Lynn Bos, Gerd Vandersteen, Pieter Rombouts, Arnd Geis, Alonso Morgado, Yves Rolain, Geert Van der Plas, Julien Ryckaert: Multirate Cascaded Discrete-Time Low-Pass ΔΣ Modulator for GSM/Bluetooth/UMTS. J. Solid-State Circuits 45(6): 1198-1208 (2010)

Arnd Geis, Julien Ryckaert, Lynn Bos, Gerd Vandersteen, Yves Rolain, Jan Craninckx: A 0.5 mm ² Power-Scalable 0.5-3.8-GHz CMOS DT-SDR Receiver With Second-Order RF Band-Pass Sampler. J. Solid-State Circuits 45(11): 2375-2387 (2010)

Gerd Vandersteen, M. Jain, Rik Pintelon: An ARMAX Identification Method for Sigma-Delta Modulators Using Only Input-Output Data. IEEE T. Instrumentation and Measurement 59(5): 1007-1012 (2010)

Stephane Bronckers, Geert Van der Plas, Gerd Vandersteen, Yves Rolain: Substrate Noise Coupling Mechanisms in Lightly Doped CMOS Transistors. IEEE T. Instrumentation and Measurement 59(6): 1727-1733 (2010)

Arnd Geis, Pierluigi Nuzzo, Julien Ryckaert, Yves Rolain, Gerd Vandersteen, Jan Craninckx: An 11.6-19.3mW 0.375-13.6GHz CMOS frequency synthesizer with rail-to-rail operation. DATE 2010: 697-701

Johan Schoukens, Gerd Vandersteen, Kurt Barbé, Rik Pintelon: Nonparametric Preprocessing in System Identification: a Powerful Tool. Eur. J. Control 15(3-4): 260-274 (2009)

Björn Debaillie, Peter Van Wesemael, Gerd Vandersteen, Jan Craninckx: Calibration of Direct-Conversion Transceivers. J. Sel. Topics Signal Processing 3(3): 488-498 (2009)

Stephane Bronckers, Karen Scheir, Geert Van der Plas, Gerd Vandersteen, Yves Rolain: A Methodology to Predict the Impact of Substrate Noise in Analog/RF Systems. IEEE Trans. on CAD of Integrated Circuits and Systems 28(11): 1613-1626 (2009)

Gerd Vandersteen, Yves Rolain, Koen Vandermot, Rik Pintelon, Johan Schoukens, Wendy Van Moer: Quasi-Analytical Bit-Error-Rate Analysis Technique Using Best Linear Approximation Modeling. IEEE T. Instrumentation and Measurement 58(2): 475-482 (2009)

Johan Schoukens, John Lataire, Rik Pintelon, Gerd Vandersteen, Tadeusz P. Dobrowiecki: Robustness Issues of the Best Linear Approximation of a Nonlinear System. IEEE T. Instrumentation and Measurement 58(5): 1737-1745 (2009)

Stephane Bronckers, Gerd Vandersteen, Ludwig De Locht, Michael Libois, Geert Van der Plas, Yves Rolain: Experimental Analysis of the Coupling Mechanisms Between a 4 GHz PPA and a 5-7 GHz LC -VCO. IEEE T. Instrumentation and Measurement 58(8): 2706-2713 (2009)

Lynn Bos, Gerd Vandersteen, Julien Ryckaert, Pieter Rombouts, Yves Rolain, Geert Van der Plas: A multirate 3.4-to-6.8mW 85-to-66dB DR GSM/bluetooth/UMTS cascade DT ΔΣM in 90nm digital CMOS. ISSCC 2009: 176-177

Karen Scheir, Gerd Vandersteen, Yves Rolain, Piet Wambacq: A 57-to-66GHz quadrature PLL in 45nm digital CMOS. ISSCC 2009: 494-495

Daan Rabijns, Wendy Van Moer, Gerd Vandersteen: Using Multisines to Measure State-of-the-Art Analog-to-Digital Converters. IEEE T. Instrumentation and Measurement 56(3): 1012-1017 (2007)

John Lataire, Gerd Vandersteen, Rik Pintelon: Interactive presentation: Optimizing analog filter designs for minimum nonlinear distortions using multisine excitations. DATE 2007: 267-272

Stephane Bronckers, Charlotte Soens, Geert Van der Plas, Gerd Vandersteen, Yves Rolain: Interactive presentation: Simulation methodology and experimental verification for the analysis of substrate noise on LC-VCO's. DATE 2007: 1520-1525

Ludwig De Locht, Gerd Vandersteen, Yves Rolain, Rik Pintelon: Estimating parameterized scalable models from the best linear approximation of nonlinear systems for accurate high-level simulations. IEEE T. Instrumentation and Measurement 55(4): 1186-1191 (2006)

Tom D'haene, Rik Pintelon, Gerd Vandersteen: An Iterative Method to Stabilize a Transfer Function in the s - and z -Domains. IEEE T. Instrumentation and Measurement 55(4): 1192-1196 (2006)

Björn Debaillie, Bruno Bougard, Gregory Lenoir, Gerd Vandersteen, Francky Catthoor: Energy-scalable OFDM transmitter design and control. DAC 2006: 536-541

Michaël Goffioul, Gerd Vandersteen, Joris Van Driessche, Björn Debaillie, Boris Come: Ensuring consistency during front-end design using an object-oriented interfacing tool called NETLISP. DAC 2006: 889-892

Gerd Vandersteen, Stephane Bronckers, Petr Dobrovolný, Yves Rolain: Systematic stability-analysis method for analog circuits. DATE 2006: 150-155

Gerd Vandersteen, Ludwig De Locht, Snezana Jenei, Yves Rolain, Rik Pintelon: Estimating Scalable Common-Denominator Laplace-Domain MIMO Models in an Errors-in-Variables Framework. DATE 2005: 1076-1081

Yves Rolain, Wendy Van Moer, Gerd Vandersteen, Johan Schoukens: Why are nonlinear microwave systems measurements so involved? IEEE T. Instrumentation and Measurement 53(3): 726-729 (2004)

Daan Rabijns, Gerd Vandersteen, Wendy Van Moer: An automatic detection scheme for periodic signals based on spectrum analyzer measurements. IEEE T. Instrumentation and Measurement 53(3): 847-853 (2004)

Rik Pintelon, Gerd Vandersteen, Ludwig De Locht, Yves Rolain, Johan Schoukens: Experimental characterization of operational amplifiers: a system identification Approach-part I: theory and Simulations. IEEE T. Instrumentation and Measurement 53(3): 854-862 (2004)

Rik Pintelon, Yves Rolain, Gerd Vandersteen, Johan Schoukens: Experimental characterization of operational amplifiers: a system identification approach-part II: calibration and measurements. IEEE T. Instrumentation and Measurement 53(3): 863-876 (2004)

Johan Schoukens, József G. Nemeth, Gerd Vandersteen, Rik Pintelon, Philippe Crama: Linearization of nonlinear dynamic systems. IEEE T. Instrumentation and Measurement 53(4): 1245-1248 (2004)

Daan Rabijns, Wendy Van Moer, Gerd Vandersteen: Spectrally pure excitation signals: only a dream? IEEE T. Instrumentation and Measurement 53(5): 1433-1440 (2004)

Geert Van der Plas, Mustafa Badaroglu, Gerd Vandersteen, Petr Dobrovolný, Piet Wambacq, Stéphane Donnay, Georges G. E. Gielen, Hugo De Man: High-level simulation of substrate noise in high-ohmic substrates with interconnect and supply effects. DAC 2004: 854-859

Gerd Vandersteen, Rik Pintelon, Dimitri Linten, Stéphane Donnay: Extended Subspace Identification of Improper Linear Systems. DATE 2004: 454-459

Petr Dobrovolný, Gerd Vandersteen, Piet Wambacq, Stéphane Donnay: Analysis and compact behavioral modeling of nonlinear distortion in analog communication circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 22(9): 1215-1227 (2003)

Petr Dobrovolný, Gerd Vandersteen, Piet Wambacq, Stéphane Donnay: Analysis and White-Box Modeling of Weakly Nonlinear Time-Varying Circuits. DATE 2003: 10624-10629

Wolfgang Eberle, Gerd Vandersteen, Piet Wambacq, Stéphane Donnay, Georges G. E. Gielen, Hugo De Man: Behavioral Modeling and Simulation of a Mixed Analog/Digital Automatic Gain Control Loop in a 5 GHz WLAN Receiver. DATE 2003: 10642-10649

Gerd Vandersteen, Alain Barel, Yves Rolain: Broadband high-frequency hybrid. IEEE T. Instrumentation and Measurement 51(6): 1204-1209 (2002)

Michaël Goffioul, Piet Wambacq, Gerd Vandersteen, Stéphane Donnay: Analysis of Nonlinearities in RF Front-End Architectures Using a Modified Volterra Series Approach . DATE 2002: 352-356

Gerd Vandersteen, Piet Wambacq, Stéphane Donnay, Frans Verbeyst: High-Frequency Nonlinear Amplifier Model for the Efficient Evaluation of Inband Distortion Under Nonlinear Load-Pull Conditions. DATE 2002: 586-590

Yves Rolain, Wendy Van Moer, Gerd Vandersteen, Marc van Heijningen: Measuring mixed-signal substrate coupling. IEEE T. Instrumentation and Measurement 50(4): 959-964 (2001)

Gerd Vandersteen, Yves Rolain, Johan Schoukens: An identification technique for data acquisition characterization in the presence of nonlinear distortions and time base distortions. IEEE T. Instrumentation and Measurement 50(5): 1355-1363 (2001)

Gerd Vandersteen, Piet Wambacq, Yves Rolain, Johan Schoukens, Stéphane Donnay, Marc Engels, Ivo Bolsens: Efficient bit-error-rate estimation of multicarrier transceivers. DATE 2001: 164-168

Piet Wambacq, Gerd Vandersteen, Joel R. Phillips, Jaijeet S. Roychowdhury, Wolfgang Eberle, Baolin Yang, David E. Long, Alper Demir: CAD for RF circuits. DATE 2001: 520-529

Gerd Vandersteen, Piet Wambacq, Yves Rolain, Petr Dobrovolný, Stéphane Donnay, Marc Engels, Ivo Bolsens: A methodology for efficient high-level dataflow simulation of mixed-signal front-ends of digital telecom transceivers. DAC 2000: 440-445

Johan Schoukens, Rik Pintelon, Gerd Vandersteen, Patrick Guillaume: Frequency-domain system identification using non-parametric noise models estimated from a small number of data sets. Automatica 33(6): 1073-1086 (1997)

Gerd Vandersteen, Yves Rolain, Johan Schoukens: Non-parametric Estimation of the Frequency-response Functions of the Linear Blocks of a Wiener-Hammerstein Model. Automatica 33(7): 1351-1355 (1997)

Rik Pintelon, Johan Schoukens, Gerd Vandersteen: Model selection through a statistical analysis of the global minimum of a weighted nonlinear least squares cost function. IEEE Transactions on Signal Processing 45(3): 686-693 (1997)