F. Voillot

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	2010
j2		R. Baillot, Y. Deshayes, L. Béchou, T. Buffeteau, I. Pianet, C. Armand, F. Voillot, S. Sorieul, Y. Ousten: Effects of silicone coating degradation on GaN MQW LEDs performances using physical and chemical analyses. Microelectronics Reliability 50(9-11): 1568-1573 (2010)
	2001
j1		Laurent Jalabert, Pierre Temple-Boyer, Gérard Sarrabayrouse, F. Cristiano, B. Colombeau, F. Voillot, C. Armand: Reduction of boron penetration through thin silicon oxide with a nitrogen doped silicon layer. Microelectronics Reliability 41(7): 981-985 (2001)

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