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Gerhard K. M. Wachutka

2000 – 2009

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2009
[j8]
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  - journals/mj/GerstenmaierKW09
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Y. C. Gerstenmaier, W. Kiffe, Gerhard K. M. Wachutka: Combination of thermal subsystems by use of rapid circuit transformation and extended two-port theory. Microelectronics Journal 40(1): 26-34 (2009)
2008
[j7]
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  - journals/mr/BorthenW08
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Peter Borthen, Gerhard K. M. Wachutka: Testing semiconductor devices at extremely high operating temperatures. Microelectronics Reliability 48(8-9): 1440-1443 (2008)
2006
[j6]
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  - journals/mj/CastellazziHW06
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Alberto Castellazzi, Martin Honsberg-Riedl, Gerhard K. M. Wachutka: Thermal characterisation of power devices during transient operation. Microelectronics Journal 37(2): 145-151 (2006)
2004
[j5]
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  - journals/tcad/ThalhammerW04
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Robert K. Thalhammer, Gerhard K. M. Wachutka: Physically rigorous modeling of internal laser-probing techniques for microstructured semiconductor devices. IEEE Trans. on CAD of Integrated Circuits and Systems 23(1): 60-70 (2004)
[j4]
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  - journals/tcad/ThalhammerW04a
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Robert K. Thalhammer, Gerhard K. M. Wachutka: Corrections to "Physically Rigorous Modeling of Internal Laser-Probing Techniques for Microstructured Semiconductor Devices". IEEE Trans. on CAD of Integrated Circuits and Systems 23(4): 581-582 (2004)
2003
[j3]
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  - journals/mr/DeckelmannWHKH03
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A. Icaza Deckelmann, Gerhard K. M. Wachutka, Franz Hirler, J. Krumrey, R. Henninger: Avalanche breakdown capability of Power DMOS Transistors and the Wunsch-Bell relation. Microelectronics Reliability 43(9-11): 1895-1900 (2003)

1990 – 1999

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1994
[j2]
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  - journals/tcad/WolbertWKM94
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Philip B. M. Wolbert, Gerhard K. M. Wachutka, Benno H. Krabbenborg, Ton J. Mouthaan: Nonisothermal device simulation using the 2D numerical process/device simulator TRENDY and application to SOI-devices. IEEE Trans. on CAD of Integrated Circuits and Systems 13(3): 293-302 (1994)
1990
[j1]
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Gerhard K. M. Wachutka: Rigorous thermodynamic treatment of heat generation and conduction in semiconductor device modeling. IEEE Trans. on CAD of Integrated Circuits and Systems 9(11): 1141-1149 (1990)