S. Wakana

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	1997
c2		K. Ozaki, H. Sekiguchi, S. Wakana, Y. Goto, Y. Umehara, J. Matsumoto: Novel Optical Probing System for Quarter-micron VLSI Circuits. Asian Test Symposium 1997: 208-213
	1996
c1		K. Ozaki, H. Sekiguchi, S. Wakana, Y. Goto, Y. Umehara, J. Matsumoto: Novel Optical Probing System with Submicron Spatial Resolution for Internal Diagnosis of VLSI Circuits. ITC 1996: 269-275

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