| 2009 | ||
|---|---|---|
| j11 | Alain Rüfenacht, Charles J. Burroughs, Samuel P. Benz, Paul D. Dresselhaus, Bryan C. Waltrip, Thomas L. Nelson: Precision Differential Sampling Measurements of Low-Frequency Synthesized Sine Waves With an AC Programmable Josephson Voltage Standard. IEEE T. Instrumentation and Measurement 58(4): 809-815 (2009) | |
| j10 | Bryan C. Waltrip, Bo Gong, Thomas L. Nelson, Yicheng Wang, Charles J. Burroughs, Alain Rüfenacht, Samuel P. Benz, Paul D. Dresselhaus: AC Power Standard Using a Programmable Josephson Voltage Standard. IEEE T. Instrumentation and Measurement 58(4): 1041-1048 (2009) | |
| 2008 | ||
| j9 | Charles J. Burroughs, Alain Rüfenacht, Samuel P. Benz, Paul D. Dresselhaus, Bryan C. Waltrip, Thomas L. Nelson: Error and Transient Analysis of Stepwise-Approximated Sine Waves Generated by Programmable Josephson Voltage Standards. IEEE T. Instrumentation and Measurement 57(7): 1322-1329 (2008) | |
| 2007 | ||
| j8 | Charles J. Burroughs, Samuel P. Benz, Paul D. Dresselhaus, Bryan C. Waltrip, Thomas L. Nelson, Yonuk Chong, Jonathan M. Williams, Dale Henderson, Pravin Patel, Luis Palafox, Ralf Behr: Development of a 60 Hz Power Standard Using SNS Programmable Josephson Voltage Standards. IEEE T. Instrumentation and Measurement 56(2): 289-294 (2007) | |
| j7 | Svetlana Avramov-Zamurovic, Andrew D. Koffman, Bryan C. Waltrip, Yicheng Wang: Evaluation of a Capacitance Scaling System. IEEE T. Instrumentation and Measurement 56(6): 2160-2163 (2007) | |
| 2005 | ||
| j6 | Eddy So, Dave Angelo, Takuhiro Tsuchiyama, Takuya Tadokoro, Bryan C. Waltrip, Tom L. Nelson: Intercomparison of calibration systems for AC shunts up to audio frequencies. IEEE T. Instrumentation and Measurement 54(2): 507-511 (2005) | |
| 2004 | ||
| c1 | David I. Bergman, Bryan C. Waltrip: Low thermal error sampling comparator for accurate settling measurements. ISCAS (1) 2004: 521-524 | |
| 2003 | ||
| j5 | Eddy So, Réjean Arseneau, David Bennett, Thomas L. Nelson, Bryan C. Waltrip: NRC-NIST intercomparison of calibration systems for current transducers with a voltage output at power frequencies. IEEE T. Instrumentation and Measurement 52(2): 424-428 (2003) | |
| j4 | David I. Bergman, Bryan C. Waltrip: A low-noise latching comparator probe for waveform sampling applications. IEEE T. Instrumentation and Measurement 52(4): 1107-1113 (2003) | |
| 2001 | ||
| j3 | Piotr S. Filipski, Cees J. van Mullem, David Janik, Manfred Klonz, Joseph R. Kinard, Thomas E. Lipe, Bryan C. Waltrip: Comparison of high-frequency AC-DC voltage transfer standards at NRC, VSL, PTB, and NIST. IEEE T. Instrumentation and Measurement 50(2): 349-352 (2001) | |
| j2 | Gerard N. Stenbakken, Dong Liu, Janusz A. Starzyk, Bryan C. Waltrip: Nonrandom quantization errors in timebases. IEEE T. Instrumentation and Measurement 50(4): 888-892 (2001) | |
| j1 | Bryan C. Waltrip, Owen B. Laug, Gerard N. Stenbakken: Improved time-base for waveform parameter estimation. IEEE T. Instrumentation and Measurement 50(4): 981-985 (2001) | |
Colors in the list of coauthors
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