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 | 2012 | |
|---|---|---|
| c12 |      | Pradip Bose, Alper Buyuktosunoglu, John A. Darringer, Meeta Sharma Gupta, Michael B. Healy, Hans M. Jacobson, Indira Nair, Jude A. Rivers, Jeonghee Shin, Augusto Vega, Alan J. Weger: Power management of multi-core chips: Challenges and pitfalls. DATE 2012: 977-982 |
| 2011 | ||
| c11 | | Jeonghee Shin, John A. Darringer, Guojie Luo, Alan J. Weger, C. L. Johnson: Early chip planning cockpit. DATE 2011: 863-866 |
| c10 | | Peilin Song, Franco Stellari, Dirk Pfeiffer, Jim Culp, Alan J. Weger, Alyssa Bonnoit, Bob Wisnieff, Marc Taubenblatt: MARVEL - Malicious alteration recognition and verification by emission of light. HOST 2011: 117-121 |
| 2010 | ||
| c9 | | Pradip Bose, Alper Buyuktosunoglu, Chen-Yong Cher, John A. Darringer, Meeta Sharma Gupta, Hendrik F. Hamann, Hans M. Jacobson, Prabhakar Kudva, Eren Kursun, Niti Madan, Indira Nair, Jude A. Rivers, Jeonghee Shin, Alan J. Weger, Victor V. Zyuban: Power-efficient, reliable microprocessor architectures: modeling and design methods. ACM Great Lakes Symposium on VLSI 2010: 299-304 |
| 2008 | ||
| c8 | | Ruchir Puri, Devadas Varma, Darvin Edwards, Alan J. Weger, Paul D. Franzon, Andrew Yang, Stephen V. Kosonocky: Keeping hot chips cool: are IC thermal problems hot air? DAC 2008: 634-635 |
| 2007 | ||
| c7 | | Jeonghwan Choi, Chen-Yong Cher, Hubertus Franke, Hendrik F. Hamann, Alan J. Weger, Pradip Bose: Thermal-aware task scheduling at the system software level. ISLPED 2007: 213-218 |
| c6 | | Hendrik F. Hamann, Alan J. Weger, James A. Lacey, Zhigang Hu, Pradip Bose, Erwin Cohen, Jamil A. Wakil: Temperature-limited microprocessors: Measurements and design implications. VLSI Design 2007: 427-432 |
| 2006 | ||
| c5 | | Franco Stellari, Peilin Song, Tim Diemoz, Alan J. Weger, Tami Vogel, Steve Wilson, John Pennings, Richard F. Rizzolo: High-Voltage and High-Power PLL Diagnostics using Advanced Cooling and Emission Images. ITC 2006: 1-10 |
| 2005 | ||
| j3 | | Stas Polonsky, M. Bhushan, A. Gattiker, Alan J. Weger, Peilin Song: Photon emission microscopy of inter/intra chip device performance variations. Microelectronics Reliability 45(9-11): 1471-1475 (2005) |
| c4 | | Peilin Song, Franco Stellari, Bill Huott, Otto Wagner, Uma Srinivasan, Yuen H. Chan, Rick Rizzolo, H. J. Nam, James P. Eckhardt, Timothy G. McNamara, Ching-Lung Tong, Alan J. Weger, Moyra K. McManus: An advanced optical diagnostic technique of IBM z990 eServer microprocessor. ITC 2005: 9 |
| 2004 | ||
| c3 | | Stas Polonsky, Keith A. Jenkins, Alan J. Weger, Shinho Cho: CMOS IC diagnostics using the luminescence of OFF-state leakage currents. ITC 2004: 134-139 |
| c2 | | Peilin Song, Franco Stellari, Alan J. Weger, Tian Xia: A Novel Scan Chain Diagnostics Technique Based on Light Emission from Leakage Current. ITC 2004: 140-147 |
| 2003 | ||
| j2 | | Franco Stellari, Peilin Song, Moyra K. McManus, Alan J. Weger, Robert Gauthier, Kiran V. Chatty, Mujahid Muhammad, Pia Sanda, Philip Wu, Steve Wilson: Latchup Analysis Using Emission Microscopy. Microelectronics Reliability 43(9-11): 1603-1608 (2003) |
| j1 | | Romain Desplats, A. Eral, Felix Beaudoin, Philippe Perdu, Alan J. Weger, Moyra K. McManus, Peilin Song, Franco Stellari: Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling. Microelectronics Reliability 43(9-11): 1663-1668 (2003) |
| c1 | | Franco Stellari, Peilin Song, Moyra K. McManus, Robert Gauthier, Alan J. Weger, Kiran V. Chatty, Mujahid Muhammad, Pia Sanda: Optical and Electrical Testing of Latchup in I/O Interface Circuits. ITC 2003: 236-245 |
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