Jonathan M. Williams

Jonathan M. Williams, Gert Rietveld, Ernest Houtzager, Theodoor J. B. M. Janssen: Design Considerations for a CCC Bridge With Complete Digital Control. IEEE T. Instrumentation and Measurement 60(12): 3907-3912 (2011)

Charles J. Burroughs, Samuel P. Benz, Paul D. Dresselhaus, Bryan C. Waltrip, Thomas L. Nelson, Yonuk Chong, Jonathan M. Williams, Dale Henderson, Pravin Patel, Luis Palafox, Ralf Behr: Development of a 60 Hz Power Standard Using SNS Programmable Josephson Voltage Standards. IEEE T. Instrumentation and Measurement 56(2): 289-294 (2007)

Nick E. Fletcher, Stephen P. Giblin, Jonathan M. Williams, K. J. Lines: New Capability for Generating and Measuring Small DC Currents at NPL. IEEE T. Instrumentation and Measurement 56(2): 326-330 (2007)

Stephen P. Giblin, Jonathan M. Williams: Automation of a Coaxial Bridge for Calibration of AC Resistors. IEEE T. Instrumentation and Measurement 56(2): 373-377 (2007)

Jonathan M. Williams, Dale Henderson, Pravin Patel, Ralf Behr, Luis Palafox: Achieving Sub-100-ns Switching of Programmable Josephson Arrays. IEEE T. Instrumentation and Measurement 56(2): 651-654 (2007)

Giancarlo Marullo-Reedtz, Roberto Cerri, Wolfgang Waldmann, Jiri Streit, Pekka Immonen, Isabelle Blanc, Felix Raso, Torsten Funck, Bernd Schumacher, Erik F. Dierikx, Mario Nunes, Peter Vrabcek, Dusan Rudohradsky, Ove Gunnarsson, Karl-Erik Rydler, Blaise Jeanneret, Beat Jeckelmann, Thomas Pulfer, Saliha Selcik Turhan, Okan Yilmaz, Jonathan M. Williams, Harald Slinde, Kare Lind, Jacques Nicolas, Matjaz Lindic, Eirini Flouda, Gábor Erdös: Comparison EUROMET.EM-K8 of DC voltage ratio: results. IEEE T. Instrumentation and Measurement 54(2): 576-579 (2005)

Ralf Behr, Jonathan M. Williams, Pravin Patel, Theodoor J. B. M. Janssen, Torsten Funck, Manfred Klonz: Synthesis of precision waveforms using a SINIS Josephson junction array. IEEE T. Instrumentation and Measurement 54(2): 612-615 (2005)

Oleg A. Chevtchenko, Helko E. van den Brom, Ernest Houtzager, Ralf Behr, Johannes Kohlmann, Jonathan M. Williams, Theodoor J. B. M. Janssen, Luis Palafox, David A. Humphreys, François P. M. Piquemal, Sophie Djordjevic, O. Monnoye, André Poletaeff, Rado Lapuh, Karl-Erik Rydler, Gunnar Eklund: Realization of a quantum standard for AC voltage: overview of a European research project. IEEE T. Instrumentation and Measurement 54(2): 628-631 (2005)

Waldemar G. Kürten, Enrico Mohns, Ralf Behr, Jonathan M. Williams, Pravin Patel, Günther Ramm, Hans Bachmair: Characterization of a high-resolution analog-to-digital converter with a Josephson AC voltage source. IEEE T. Instrumentation and Measurement 54(2): 649-652 (2005)

Giancarlo Marullo-Reedtz, Roberto Cerri, Isabelle Blanc, Ove Gunnarsson, Jonathan M. Williams, Felix Raso, Kyu-Tae Kim, Robert B. Frenkel, Zhang Xiuzeng, Alexander S. Katkov, Ronald Dziuba, Mark Parker, Barry M. Wood, Laurie A. Christian, Eddie Tarnow, Surender K. Mahajan, Ajeet Singh, Yasuhiko Sakamoto: Comparison CCEM-K8 of DC voltage ratio: results. IEEE T. Instrumentation and Measurement 52(2): 419-423 (2003)

Ralf Behr, Johannes Kohlmann, Theodoor J. B. M. Janssen, Peter Kleinschmidt, Jonathan M. Williams, Sophie Djordjevic, Jean-Pierre Lo-Hive, François P. M. Piquemal, Per-Otto Hetland, Dominique Reymann, Gunnar Eklund, Christian Hof, Blaise Jeanneret, Oleg A. Chevtchenko, Ernest Houtzager, Helko E. van den Brom, Andrea Sosso, Domenico Andreone, Jaani Nissilä, Panu Helistö: Analysis of different measurement setups for a programmable Josephson voltage standard. IEEE T. Instrumentation and Measurement 52(2): 524-528 (2003)

Jürgen Melcher, Jürgen Schurr, Klaus Pierz, Jonathan M. Williams, Stephen P. Giblin, F. Cabiati, Luca Callegaro, Giancarlo Marullo-Reedtz, Cristina Cassiago, Beat Jeckelmann, Blaise Jeanneret, Frédéric Overney, Jaroslav Bohacek, J. Riha, O. Power, J. Murray, Mario Nunes, M. Lobo, I. Godinho: The European ACQHE project: modular system for the calibration of capacitance standards based on the quantum Hall effect. IEEE T. Instrumentation and Measurement 52(2): 563-568 (2003)

Bernd Schumacher, Peter Warnecke, W. Poirier, I. Delgado, Z. Msimang, Giorgio Boella, Per-Otto Hetland, Randolph E. Elmquist, Jonathan M. Williams, David Inglis, Beat Jeckelmann, Ove Gunnarsson, Alexandre Satrapinsky: Transport behavior of commercially available 100-Ω standard resistors. IEEE T. Instrumentation and Measurement 50(2): 242-244 (2001)